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ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA
| ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : International Test Conference, 2001 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Circuits - Testing Telecommunication Radio frequency Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996217698303316 |
| [Place of publication not identified], : International Test Conference, 2001 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA
| ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : International Test Conference, 2001 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Circuits - Testing Telecommunication Radio frequency Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872966803321 |
| [Place of publication not identified], : International Test Conference, 2001 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Practical design verification / / edited by Dhiraj K. Pradhan, Ian G. Harris [[electronic resource]]
| Practical design verification / / edited by Dhiraj K. Pradhan, Ian G. Harris [[electronic resource]] |
| Pubbl/distr/stampa | Cambridge : , : Cambridge University Press, , 2009 |
| Descrizione fisica | 1 online resource (xi, 276 pages) : digital, PDF file(s) |
| Disciplina | 621.3815/48 |
| Soggetto topico | Integrated circuits - Verification |
| ISBN |
1-107-19643-4
1-282-39124-0 0-511-64683-6 9786612391248 0-511-62691-6 0-511-57932-2 0-511-65091-4 0-511-57858-X 0-511-58006-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Model checking and equivalence checking / Masahiro Fujita -- Transaction-level system modeling / Daniel Gajski and Samar Abdi -- Response checkers, monitors, and assertions / Harry Foster -- System debugging strategies / Wayne H. Wolf -- Test generation and coverage metrics / Ernesto Sánchez, Giovanni Squillero, and Matteo Sonza Reorda -- SystemVerilog and Vera in a verification flow / Shireesh Verma and Ian G. Harris -- Decision diagrams for verification / Maciej Ciesielski, Dhiraj K. Pradhan, and Abusaleh M. Jabir -- Boolean satisfiability and EDA applications / Joao Marques-Silva. |
| Record Nr. | UNINA-9910454505003321 |
| Cambridge : , : Cambridge University Press, , 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Practical design verification / / edited by Dhiraj K. Pradhan, Ian G. Harris [[electronic resource]]
| Practical design verification / / edited by Dhiraj K. Pradhan, Ian G. Harris [[electronic resource]] |
| Pubbl/distr/stampa | Cambridge : , : Cambridge University Press, , 2009 |
| Descrizione fisica | 1 online resource (xi, 276 pages) : digital, PDF file(s) |
| Disciplina | 621.3815/48 |
| Soggetto topico | Integrated circuits - Verification |
| ISBN |
1-107-19643-4
1-282-39124-0 0-511-64683-6 9786612391248 0-511-62691-6 0-511-57932-2 0-511-65091-4 0-511-57858-X 0-511-58006-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Model checking and equivalence checking / Masahiro Fujita -- Transaction-level system modeling / Daniel Gajski and Samar Abdi -- Response checkers, monitors, and assertions / Harry Foster -- System debugging strategies / Wayne H. Wolf -- Test generation and coverage metrics / Ernesto Sánchez, Giovanni Squillero, and Matteo Sonza Reorda -- SystemVerilog and Vera in a verification flow / Shireesh Verma and Ian G. Harris -- Decision diagrams for verification / Maciej Ciesielski, Dhiraj K. Pradhan, and Abusaleh M. Jabir -- Boolean satisfiability and EDA applications / Joao Marques-Silva. |
| Record Nr. | UNINA-9910777912103321 |
| Cambridge : , : Cambridge University Press, , 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Practical design verification / / Diraj Pradhan, Ian G. Harris
| Practical design verification / / Diraj Pradhan, Ian G. Harris |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | New York, : Cambridge University Press, c2009 |
| Descrizione fisica | 1 online resource (xi, 276 pages) : digital, PDF file(s) |
| Disciplina | 621.3815/48 |
| Altri autori (Persone) |
PradhanDiraj
HarrisIan G |
| Soggetto topico |
Integrated circuits - Verification
Electronic circuits |
| ISBN |
1-107-19643-4
1-282-39124-0 0-511-64683-6 9786612391248 0-511-62691-6 0-511-57932-2 0-511-65091-4 0-511-57858-X 0-511-58006-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Model checking and equivalence checking / Masahiro Fujita -- Transaction-level system modeling / Daniel Gajski and Samar Abdi -- Response checkers, monitors, and assertions / Harry Foster -- System debugging strategies / Wayne H. Wolf -- Test generation and coverage metrics / Ernesto Sánchez, Giovanni Squillero, and Matteo Sonza Reorda -- SystemVerilog and Vera in a verification flow / Shireesh Verma and Ian G. Harris -- Decision diagrams for verification / Maciej Ciesielski, Dhiraj K. Pradhan, and Abusaleh M. Jabir -- Boolean satisfiability and EDA applications / Joao Marques-Silva. |
| Record Nr. | UNINA-9910806217303321 |
| New York, : Cambridge University Press, c2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings
| Proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : The Conference, 1997 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Congresses - Testing
Electronic digital computers - Testing - Congresses - Circuits Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| ISBN | 0-7803-4210-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | International Test Conference 1997 |
| Record Nr. | UNISA-996212474403316 |
| [Place of publication not identified], : The Conference, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings - International Test Conference (25th : 1994 : Washington D.C)
| Proceedings - International Test Conference (25th : 1994 : Washington D.C) |
| Pubbl/distr/stampa | [Place of publication not identified], : The Conference, 1994 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing - Congresses
Electronic digital computers - Testing - Congresses - Circuits Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996214346903316 |
| [Place of publication not identified], : The Conference, 1994 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings - International Test Conference (25th : 1994 : Washington D.C)
| Proceedings - International Test Conference (25th : 1994 : Washington D.C) |
| Pubbl/distr/stampa | [Place of publication not identified], : The Conference, 1994 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing - Congresses
Electronic digital computers - Testing - Congresses - Circuits Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872779003321 |
| [Place of publication not identified], : The Conference, 1994 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings International Test Conference 2002
| Proceedings International Test Conference 2002 |
| Pubbl/distr/stampa | [Place of publication not identified], : International Test Conference, 2002 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Testing - Circuits Telecommunication Radio frequency Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996211258803316 |
| [Place of publication not identified], : International Test Conference, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings International Test Conference 2002
| Proceedings International Test Conference 2002 |
| Pubbl/distr/stampa | [Place of publication not identified], : International Test Conference, 2002 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Testing - Circuits Telecommunication Radio frequency Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872810403321 |
| [Place of publication not identified], : International Test Conference, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
