top

  Info

  • Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.

  Info

  • Utilizzare questo link per rimuovere la selezione effettuata.
ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan
ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan
Pubbl/distr/stampa [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1998
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Congresses - Testing
Semiconductors - Congresses - Testing
Electronic apparatus and appliances - Testing - Congresses
Electrical & Computer Engineering
Electrical Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872859203321
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1998
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
Pubbl/distr/stampa [Place of publication not identified], : International Test Conference, 2004
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Testing - Circuits
Telecommunication
Radio frequency
Electrical Engineering
Electrical & Computer Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996202164503316
[Place of publication not identified], : International Test Conference, 2004
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
Pubbl/distr/stampa [Place of publication not identified], : International Test Conference, 2004
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Electronic digital computers - Testing - Circuits
Telecommunication
Radio frequency
Electrical Engineering
Electrical & Computer Engineering
Engineering & Applied Sciences
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872538803321
[Place of publication not identified], : International Test Conference, 2004
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
International Test Conference, 1991 : proceedings
International Test Conference, 1991 : proceedings
Pubbl/distr/stampa [Place of publication not identified], : The Conference, 1991
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Automatic test equipment
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996211378203316
[Place of publication not identified], : The Conference, 1991
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
International Test Conference, 1991 : proceedings
International Test Conference, 1991 : proceedings
Pubbl/distr/stampa [Place of publication not identified], : The Conference, 1991
Disciplina 621.3815/48
Soggetto topico Integrated circuits - Testing
Automatic test equipment
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872846903321
[Place of publication not identified], : The Conference, 1991
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Introduction to electrical circuit analysis / / Ozgur Ergul
Introduction to electrical circuit analysis / / Ozgur Ergul
Autore Ergul Ozgur
Pubbl/distr/stampa Hoboken, New Jersey : , : Wiley, , 2017
Descrizione fisica 1 online resource (425 pages) : illustrations
Disciplina 621.3815/48
Soggetto topico Electric circuits
ISBN 9781119284949
1119284945
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910795964003321
Ergul Ozgur  
Hoboken, New Jersey : , : Wiley, , 2017
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Introduction to electrical circuit analysis / / Ozgur Ergul
Introduction to electrical circuit analysis / / Ozgur Ergul
Autore Ergul Ozgur
Pubbl/distr/stampa Hoboken, New Jersey : , : Wiley, , 2017
Descrizione fisica 1 online resource (425 pages) : illustrations
Disciplina 621.3815/48
Soggetto topico Electric circuits
ISBN 9781119284949
1119284945
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910808960203321
Ergul Ozgur  
Hoboken, New Jersey : , : Wiley, , 2017
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Introduction to electrical circuit analysis / / Özgür Ergül
Introduction to electrical circuit analysis / / Özgür Ergül
Autore Ergül Özgür
Pubbl/distr/stampa Hoboken, New Jersey : , : Wiley, , 2017
Descrizione fisica 1 online resource (425 pages) : illustrations
Disciplina 621.3815/48
Soggetto topico Electric circuits
Soggetto genere / forma Electronic books.
ISBN 1-119-28491-0
1-119-28494-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Basic tools : Kirchhoff's laws -- Analysis of resistive networks : nodal analysis -- Analysis of resistive networks : mesh analysis -- Black-box concept -- Transient analysis -- Steady-state analysis of time-harmonic circuits -- Selected components of modern circuits -- Practical technologies in modern circuits -- In the next steps -- Photographs of some circuit elements -- Exercise solutions.
Record Nr. UNINA-9910466087903321
Ergül Özgür  
Hoboken, New Jersey : , : Wiley, , 2017
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
IOLTS 2004 : 10th IEEE International On-Line Testing Symposium : proceedings : 12-14 July, 2004, Funchal, Madeira Island, Portugal
IOLTS 2004 : 10th IEEE International On-Line Testing Symposium : proceedings : 12-14 July, 2004, Funchal, Madeira Island, Portugal
Pubbl/distr/stampa [Place of publication not identified], : IEEE Computer Society, 2004
Disciplina 621.3815/48
Soggetto topico Electronic circuits - Testing
Online data processing
Electronic circuit design
Error-correcting codes (Information theory)
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996199769503316
[Place of publication not identified], : IEEE Computer Society, 2004
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
IOLTS 2004 : 10th IEEE International On-Line Testing Symposium : proceedings : 12-14 July, 2004, Funchal, Madeira Island, Portugal
IOLTS 2004 : 10th IEEE International On-Line Testing Symposium : proceedings : 12-14 July, 2004, Funchal, Madeira Island, Portugal
Pubbl/distr/stampa [Place of publication not identified], : IEEE Computer Society, 2004
Disciplina 621.3815/48
Soggetto topico Electronic circuits - Testing
Online data processing
Electronic circuit design
Error-correcting codes (Information theory)
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872523603321
[Place of publication not identified], : IEEE Computer Society, 2004
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui