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Materials degradation and its control by surface engineering [[electronic resource] /] / A.W. Batchelor, Loh Nee Lam, Margam Chandrasekaran
Materials degradation and its control by surface engineering [[electronic resource] /] / A.W. Batchelor, Loh Nee Lam, Margam Chandrasekaran
Autore Batchelor A. W (Andrew W.)
Edizione [3rd ed.]
Pubbl/distr/stampa London, : Imperial College Press
Descrizione fisica 1 online resource (420 p.)
Disciplina 620.44
Altri autori (Persone) Loh Nee Lam
ChandrasekaranMargam
Soggetto topico Surfaces (Technology)
Corrosion and anti-corrosives
Mechanical wear
Fracture mechanics
ISBN 1-283-23451-3
9786613234513
1-84816-502-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto pt. 1. Mechanisms of materials degradation -- pt. 2. Surface engineering -- pt. 3. Application of control techniques.
Record Nr. UNINA-9910789063903321
Batchelor A. W (Andrew W.)  
London, : Imperial College Press
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Materials degradation and its control by surface engineering [[electronic resource] /] / A.W. Batchelor, Loh Nee Lam, Margam Chandrasekaran
Materials degradation and its control by surface engineering [[electronic resource] /] / A.W. Batchelor, Loh Nee Lam, Margam Chandrasekaran
Autore Batchelor A. W (Andrew W.)
Edizione [3rd ed.]
Pubbl/distr/stampa London, : Imperial College Press
Descrizione fisica 1 online resource (420 p.)
Disciplina 620.44
Altri autori (Persone) Loh Nee Lam
ChandrasekaranMargam
Soggetto topico Surfaces (Technology)
Corrosion and anti-corrosives
Mechanical wear
Fracture mechanics
ISBN 1-283-23451-3
9786613234513
1-84816-502-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto pt. 1. Mechanisms of materials degradation -- pt. 2. Surface engineering -- pt. 3. Application of control techniques.
Record Nr. UNINA-9910816876403321
Batchelor A. W (Andrew W.)  
London, : Imperial College Press
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Materials Forming, Machining and Post Processing [[electronic resource] /] / edited by Kapil Gupta
Materials Forming, Machining and Post Processing [[electronic resource] /] / edited by Kapil Gupta
Edizione [1st ed. 2020.]
Pubbl/distr/stampa Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020
Descrizione fisica 1 online resource (VIII, 268 p.)
Disciplina 620.44
Collana Materials Forming, Machining and Tribology
Soggetto topico Surfaces (Technology)
Thin films
Coatings
Tribology
Corrosion and anti-corrosives
Machinery
Surfaces, Interfaces and Thin Film
Corrosion
Machinery and Machine Elements
ISBN 9783030188542
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Materials Forming -- Machining -- Post Processing.
Record Nr. UNINA-9910366618903321
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020
Materiale a stampa
Lo trovi qui: Univ. Federico II
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The materials science of thin films [e-book] / Milton Ohring
The materials science of thin films [e-book] / Milton Ohring
Autore Ohring, Milton, 1936-
Pubbl/distr/stampa Boston : Academic Press, c1992
Descrizione fisica xx, 704 p. : ill. ; 24 cm
Disciplina 620.44
Altri autori (Enti) Elsevier Science Publishers
Soggetto topico Thin films
Soggetto genere / forma Electronic books
ISBN 9780080511184
Formato Risorse elettroniche
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISALENTO-991003221579707536
Ohring, Milton, 1936-  
Boston : Academic Press, c1992
Risorse elettroniche
Lo trovi qui: Univ. del Salento
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Materials surface processing by directed energy techniques [e-book] / edited by Yves Pauleau
Materials surface processing by directed energy techniques [e-book] / edited by Yves Pauleau
Pubbl/distr/stampa Oxford : Elsevier, 2006
Descrizione fisica xxi, 722 p. : ill. ; 25 cm
Disciplina 620.44
Altri autori (Persone) Pauleau, Yves
Altri autori (Enti) European Materials Research Society
Soggetto topico Surfaces (Technology)
Coating processes
Thin films
Soggetto genere / forma Electronic books.
ISBN 9780080444963
0080444962
Formato Risorse elettroniche
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Preface -- 1. Interaction of Ions and Electrons with Solid Surfaces -- 2. Laser Beam-Solid Interactions : Fundamental Aspects -- 3. Magnetron Discharges for Thin Films Plasma Processing -- 4. Surface Modification of Materials by Plasma Immersion Ion Implantation -- 5. Ion Surface Treatment of Materials -- 6. Surface Treatment of Materials with Low-Energy, High-Current -- 7. Laser Processing for Surface Modification by Remelting and Alloying of Metallic Systems -- 8. Growth of Coatings by Pulsed Laser Deposition -- 9. Thermal Plasmas Surface Treatment -- 10. Thin Film Growth by Ion Beam Assisted Deposition Techniques -- 11. Cathodic Arc Evaporation -- 12. Spectroscopic Analyses of Surfaces and Thin Films -- 13. Formation and Characterization of the Structure of Thin Films and Coatings -- 14. Mechanical Characterizations of Surfaces and Coatings -- 15. etermination and Generation Mechanisms of Residual -- 16. Hard Coatings Based on Metal Nitrides, Metal Carbides and Nanocomposite Materials : PVD Process and Properties -- 17. Friction Mechanisms and Fundamental Aspects in Solid Lubricant Coatings -- 18. Corrosion and Wear Resistant Coatings Formed by Ion Beam Techniques -- 19. High Temperature Behaviour of Thermal Barrier and Bond Coatings in Oxidizing and Corrosive Atmospheres -- 20. Polymer Films Produced by Plasma Polymerization -- Index
Record Nr. UNISALENTO-991003232349707536
Oxford : Elsevier, 2006
Risorse elettroniche
Lo trovi qui: Univ. del Salento
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Measurement techniques and practices of colloid and interface phenomena [e-book] / Masahiko Abe, editor
Measurement techniques and practices of colloid and interface phenomena [e-book] / Masahiko Abe, editor
Descrizione fisica 1 online resource (x, 145 p. 85 illus., 28 illus. in color.)
Disciplina 620.44
Altri autori (Persone) Abe, Masahikoauthor
Soggetto topico Surfaces (Technology) - Analysis
Chemistry, Technical
Colloids
Soggetto genere / forma Electronic books
ISBN 9789811359316
9811359318
9789811359309
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISALENTO-991003951859707536
Materiale a stampa
Lo trovi qui: Univ. del Salento
Opac: Controlla la disponibilità qui
Metal Impurities in Silicon-Device Fabrication [[electronic resource] /] / by Klaus Graff
Metal Impurities in Silicon-Device Fabrication [[electronic resource] /] / by Klaus Graff
Autore Graff Klaus
Edizione [1st ed. 1995.]
Pubbl/distr/stampa Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1995
Descrizione fisica 1 online resource (IX, 216 p.)
Disciplina 620.44
Collana Springer Series in Materials Science
Soggetto topico Materials—Surfaces
Thin films
Electronics
Microelectronics
Inorganic chemistry
Surfaces and Interfaces, Thin Films
Electronics and Microelectronics, Instrumentation
Inorganic Chemistry
ISBN 3-642-97593-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 1. Introduction -- 2. Common Properties of Transition Metals -- 2.1 General Behavior -- 2.2 Contamination of Silicon Wafers -- 2.3 Impact on Device Performance -- 3. Properties of Transition Metals in Silicon -- 3.1 Solubilities -- 3.2 Diffusivities -- 3.3 Dissolved Impurities -- 3.4 Precipitated Metals -- 4. Properties of the Main Impurities -- 4.1 Iron -- 4.2 Nickel -- 4.3 Copper -- 4.4 Molybdenum -- 4.5 Palladium -- 4.6 Platinum -- 4.7 Gold -- 5. Properties of Rare Impurities -- 5.1 Scandium -- 5.2 Titanium -- 5.3 Vanadium -- 5.4 Chromium -- 5.5 Manganese -- 5.6 Cobalt -- 5.7 Zinc -- 5.8 Rhodium -- 5.9 Silver -- 5.10 Tantalum -- 5.11 Tungsten -- 5.12 Mercury -- 6. Detection Methods -- 6.1 Detection of Total Impurity Content -- 6.2 Detection of Dissolved Impurities -- 6.3 Detection of Precipitates -- 7. Requirements of Modern Technology -- 7.1 Reduction of Contamination -- 8. Gettering of Impurities -- 8.1 Gettering Mechanisms -- 8.2 Control of Gettering Efficiency -- 9. Conclusion and Future Trends -- References.
Record Nr. UNINA-9910480192003321
Graff Klaus  
Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1995
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Metal Impurities in Silicon-Device Fabrication [[electronic resource] /] / by Klaus Graff
Metal Impurities in Silicon-Device Fabrication [[electronic resource] /] / by Klaus Graff
Autore Graff Klaus
Edizione [1st ed. 1995.]
Pubbl/distr/stampa Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1995
Descrizione fisica 1 online resource (IX, 216 p.)
Disciplina 620.44
Collana Springer Series in Materials Science
Soggetto topico Materials—Surfaces
Thin films
Electronics
Microelectronics
Inorganic chemistry
Surfaces and Interfaces, Thin Films
Electronics and Microelectronics, Instrumentation
Inorganic Chemistry
ISBN 3-642-97593-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 1. Introduction -- 2. Common Properties of Transition Metals -- 2.1 General Behavior -- 2.2 Contamination of Silicon Wafers -- 2.3 Impact on Device Performance -- 3. Properties of Transition Metals in Silicon -- 3.1 Solubilities -- 3.2 Diffusivities -- 3.3 Dissolved Impurities -- 3.4 Precipitated Metals -- 4. Properties of the Main Impurities -- 4.1 Iron -- 4.2 Nickel -- 4.3 Copper -- 4.4 Molybdenum -- 4.5 Palladium -- 4.6 Platinum -- 4.7 Gold -- 5. Properties of Rare Impurities -- 5.1 Scandium -- 5.2 Titanium -- 5.3 Vanadium -- 5.4 Chromium -- 5.5 Manganese -- 5.6 Cobalt -- 5.7 Zinc -- 5.8 Rhodium -- 5.9 Silver -- 5.10 Tantalum -- 5.11 Tungsten -- 5.12 Mercury -- 6. Detection Methods -- 6.1 Detection of Total Impurity Content -- 6.2 Detection of Dissolved Impurities -- 6.3 Detection of Precipitates -- 7. Requirements of Modern Technology -- 7.1 Reduction of Contamination -- 8. Gettering of Impurities -- 8.1 Gettering Mechanisms -- 8.2 Control of Gettering Efficiency -- 9. Conclusion and Future Trends -- References.
Record Nr. UNINA-9910792491703321
Graff Klaus  
Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1995
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Metal Impurities in Silicon-Device Fabrication [[electronic resource] /] / by Klaus Graff
Metal Impurities in Silicon-Device Fabrication [[electronic resource] /] / by Klaus Graff
Autore Graff Klaus
Edizione [1st ed. 1995.]
Pubbl/distr/stampa Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1995
Descrizione fisica 1 online resource (IX, 216 p.)
Disciplina 620.44
Collana Springer Series in Materials Science
Soggetto topico Materials—Surfaces
Thin films
Electronics
Microelectronics
Inorganic chemistry
Surfaces and Interfaces, Thin Films
Electronics and Microelectronics, Instrumentation
Inorganic Chemistry
ISBN 3-642-97593-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 1. Introduction -- 2. Common Properties of Transition Metals -- 2.1 General Behavior -- 2.2 Contamination of Silicon Wafers -- 2.3 Impact on Device Performance -- 3. Properties of Transition Metals in Silicon -- 3.1 Solubilities -- 3.2 Diffusivities -- 3.3 Dissolved Impurities -- 3.4 Precipitated Metals -- 4. Properties of the Main Impurities -- 4.1 Iron -- 4.2 Nickel -- 4.3 Copper -- 4.4 Molybdenum -- 4.5 Palladium -- 4.6 Platinum -- 4.7 Gold -- 5. Properties of Rare Impurities -- 5.1 Scandium -- 5.2 Titanium -- 5.3 Vanadium -- 5.4 Chromium -- 5.5 Manganese -- 5.6 Cobalt -- 5.7 Zinc -- 5.8 Rhodium -- 5.9 Silver -- 5.10 Tantalum -- 5.11 Tungsten -- 5.12 Mercury -- 6. Detection Methods -- 6.1 Detection of Total Impurity Content -- 6.2 Detection of Dissolved Impurities -- 6.3 Detection of Precipitates -- 7. Requirements of Modern Technology -- 7.1 Reduction of Contamination -- 8. Gettering of Impurities -- 8.1 Gettering Mechanisms -- 8.2 Control of Gettering Efficiency -- 9. Conclusion and Future Trends -- References.
Record Nr. UNINA-9910817421703321
Graff Klaus  
Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1995
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Metallic Butterfly Wing Scales [[electronic resource] ] : Superstructures with High Surface-Enhancement Properties for Optical Applications / / by Jiajun Gu, Di Zhang, Yongwen Tan
Metallic Butterfly Wing Scales [[electronic resource] ] : Superstructures with High Surface-Enhancement Properties for Optical Applications / / by Jiajun Gu, Di Zhang, Yongwen Tan
Autore Gu Jiajun
Edizione [1st ed. 2015.]
Pubbl/distr/stampa Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015
Descrizione fisica 1 online resource (99 p.)
Disciplina 620.11
620.11295
620.11297
620.44
Collana SpringerBriefs in Materials
Soggetto topico Optical materials
Electronic materials
Lasers
Photonics
Biotechnology
Nanotechnology
Materials science
Materials—Surfaces
Thin films
Optical and Electronic Materials
Optics, Lasers, Photonics, Optical Devices
Microengineering
Nanotechnology and Microengineering
Characterization and Evaluation of Materials
Surfaces and Interfaces, Thin Films
ISBN 3-319-12535-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Background -- Towards Metallic Butterfly Wing Scales -- Metal Scale Replicas Prepared via Electroless Deposition -- SERS Performance of Au Scale Replicas -- SERS Mechanisms of Metal Scale Replicas -- Conclusions and Perspectives.
Record Nr. UNINA-9910298622603321
Gu Jiajun  
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015
Materiale a stampa
Lo trovi qui: Univ. Federico II
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