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The NIST plan for providing public access to results of federally funded research / / Katherine E. Sharpless; Regina L. Avila; Sally S. Bruce; Wo L. Chang; Virginia Covahey; Robert M. Dimeo; A. Kirk Dohne; Heather Evans; Aaron P. Fein; Donna J. Kimball; Andrea M. Medina-Smith; Alan E. Munter; James K. Olthoff; Dianne L. Poster; Kathleen M. Roberts; Susannah B. Schiller; John Henry J. Scott; Barbara P. Silcox; James A. St. Pierre; Mark D. Stiles
| The NIST plan for providing public access to results of federally funded research / / Katherine E. Sharpless; Regina L. Avila; Sally S. Bruce; Wo L. Chang; Virginia Covahey; Robert M. Dimeo; A. Kirk Dohne; Heather Evans; Aaron P. Fein; Donna J. Kimball; Andrea M. Medina-Smith; Alan E. Munter; James K. Olthoff; Dianne L. Poster; Kathleen M. Roberts; Susannah B. Schiller; John Henry J. Scott; Barbara P. Silcox; James A. St. Pierre; Mark D. Stiles |
| Autore | Sharpless Katherine |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2015 |
| Descrizione fisica | 1 online resource (67 pages) : illustrations (some color) |
| Altri autori (Persone) |
AvilaRegina L
BruceSally S ChangWo L CovaheyVirginia DimeoRobert M DohneA. Kirk EvansHeather Evans FeinAaron P KimballDonna J Medina-SmithAndrea M MunterAlan E OlthoffJames K PosterDianne L RobertsKathleen M SchillerSusannah B ScottJohn Henry J SharplessKatherine SilcoxBarbara P St. PierreJames A StilesMark D |
| Collana | NISTIR |
| Soggetto topico |
Communication in science
Federal aid to research |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710790403321 |
Sharpless Katherine
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Scanning Electron Microscopy and X-Ray Microanalysis [[electronic resource] /] / by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
| Scanning Electron Microscopy and X-Ray Microanalysis [[electronic resource] /] / by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy |
| Autore | Goldstein Joseph I |
| Edizione | [4th ed. 2018.] |
| Pubbl/distr/stampa | New York, NY : , : Springer New York : , : Imprint : Springer, , 2018 |
| Descrizione fisica | 1 online resource (XXIII, 550 p. 546 illus., 409 illus. in color.) |
| Disciplina | 620.11 |
| Soggetto topico |
Materials science
Spectroscopy Microscopy Physical measurements Measurement Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation |
| ISBN | 1-4939-6676-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Preface -- Scanning Electron Microscopy and Associated Techniques: Overview -- Electron Beam – Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis: from k-ratio to Composition -- Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles -- Compositional Mapping -- Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM) -- Energy Dispersive X-ray Microanalysis Checklist -- X-ray Microanalysis Case Studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused Ion Beam Applications in the SEM laboratory -- Ion Beam Microscopy -- Appendix – A Database of Electron-Solid Interactions -- Index. |
| Record Nr. | UNINA-9910298587303321 |
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Goldstein Joseph I
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| New York, NY : , : Springer New York : , : Imprint : Springer, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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