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Autore: | Spence John C. H |
Titolo: | High-resolution electron microscopy [[electronic resource] /] / John C.H. Spence |
Pubblicazione: | New York, : Oxford University Press, 2009 |
Edizione: | 3rd ed. |
Descrizione fisica: | 1 online resource (425 p.) |
Disciplina: | 502.825 |
535.3325 | |
Soggetto topico: | Transmission electron microscopes |
Electron microscopy | |
Note generali: | Description based upon print version of record. |
Nota di bibliografia: | Includes bibliographies and index. |
Nota di contenuto: | Contents; 1 Preliminaries; 2 Electron Optics; 3 Wave Optics; 4 Coherence and Fourier Optics; 5 High-Resolution Images of Crystals and their Defects; 6 HREM in Biology, Organic Crystals, and Radiation Damage; 7 Image Processing and Super-Resolution Schemes; 8 STEM and Z-contrast; 9 Electron Sources and Detectors; 10 Measurement of Electron-Optical Parameters; 11 Instabilities and the Microscope Environment; 12 Experimental Methods; 13 Associated Techniques; Appendices; Index |
Sommario/riassunto: | This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added. - ;The discovery of the Nanotube in 1991 by electron microscopy has ushered in the era of Nanoscience. The atomic-resolution electron microscope has been a crucial tool in this effort. This book gives the basic theoretical background needed to understand how electron microscopes allow us |
Titolo autorizzato: | High-resolution electron microscopy |
ISBN: | 0-19-170866-6 |
1-281-97574-5 | |
9786611975746 | |
0-19-156461-3 | |
Formato: | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910819813103321 |
Lo trovi qui: | Univ. Federico II |
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