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GaN-based materials and devices : growth, fabrication, characterization and performance / / editors, M.S. Shur, R.F. Davis



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Titolo: GaN-based materials and devices : growth, fabrication, characterization and performance / / editors, M.S. Shur, R.F. Davis Visualizza cluster
Pubblicazione: Singapore ; ; River Edge, N.J., : World Scientific, c2004
Edizione: 33th ed.
Descrizione fisica: 1 online resource (295 p.)
Disciplina: 537.6223
621.38152
Soggetto topico: Gallium nitride
Semiconductors
Altri autori: ShurMichael  
DavisRobert F <1942-> (Robert Foster)  
Note generali: Description based upon print version of record.
Nota di bibliografia: Includes bibliographical references.
Nota di contenuto: Preface; CONTENTS; Materials Properties of Nitrides. Summary; Kinetics, Microstructure and Strain in GaN Thin Films Grown Via Pendeo-Epitaxy; Strain of GaN Layers Grown Using 6H-SiC(0001) Substrates with Different Buffer Layers; Growth of Thick GaN Films and Seeds for Bulk Crystal Growth; Cracking of GaN Films; Direct Bonding of GaN and SiC; A Novel Technique for Electronic Device Fabrication; Electronic Properties of GaN (0001) - Dielectronic Interfaces; Transport and Noise Properties; Quasi-Ballistic and Overshoot Transport in Group III-Nitrides; High Field Transport in AIN
Generation-Recombination Noise in GaN-Based DevicesInsulated Gate III-N Heterostructure Field-Effect Transistors; High Voltage AIGaN/GaN Heterojunction Transistors; Etched Aperture GaN CAVET Through Photoelectrochemical Wet Etching; n-AlGaAs/p-GaAs/n-GaN Heterojunction Bipolar Transistor: The First Transistor Formed Via Wafer Fusion
Sommario/riassunto: The unique materials properties of GaN-based semiconductors havestimulated a great deal of interest in research and developmentregarding nitride materials growth and optoelectronic andnitride-based electronic devices. High electron mobility andsaturation velocity, high sheet carrier concentration atheterojunction interfaces, high breakdown field, and low thermalimpedance of GaN-based films grown over SiC or bulk AlN substratesmake nitride-based electronic devices very promising.
Titolo autorizzato: GaN-based materials and devices  Visualizza cluster
ISBN: 1-281-34762-0
9786611347628
981-256-236-2
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910814534303321
Lo trovi qui: Univ. Federico II
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Serie: Selected topics in electronics and systems ; ; v. 33.