Introduction to scanning tunneling microscopy [[electronic resource] /] / C. Julian Chen
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| Autore: |
Chen C. Julian
|
| Titolo: |
Introduction to scanning tunneling microscopy [[electronic resource] /] / C. Julian Chen
|
| Pubblicazione: | New York, : Oxford University Press, 1993 |
| Descrizione fisica: | 1 online resource (469 p.) |
| Disciplina: | 502/.8/2 |
| Soggetto topico: | Scanning tunneling microscopy |
| Microscopy | |
| Note generali: | Description based upon print version of record. |
| Nota di bibliografia: | Includes bibliographical references (p. 383-404) and index. |
| Nota di contenuto: | Contents; List of Figures; Gallery of STM Images; 1 Overview; PART I: IMAGING MECHANISM; PART II : INSTRUMENTATION; Appendix A: Real wavefunctions; Appendix B: Green's functions; Appendix C: Spherical modified Bessel functions; Appendix D: Two-dimensional Fourier series; Appendix E: Plane groups and invariant functions; Appendix F: Elementary elasticity theory; Appendix G: A short table of Laplace transforms; Appendix H: Operational amplifiers; References; Index |
| Sommario/riassunto: | A graduate-level introduction to scanning tunnelling microscopy, which explains how the method's ability to map microscopic surfaces non-destructively has found major applications in physics, surface science, materials science, biology, chemistry and engineering. |
| Titolo autorizzato: | Introduction to scanning tunneling microscopy |
| ISBN: | 0-19-773239-9 |
| 0-19-802356-1 | |
| 1-4237-6461-7 | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910777534003321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |
Serie:
Oxford series in optical and imaging sciences ; ; 4.