Chemical Bonding in Crystals and Their Properties

• Autore: Vologzhanina Anna V
• Pubblicazione: Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020
• Descrizione fisica: 1 online resource (144 p.)
• Soggetto topico: Research & information: general
• Soggetto non controllato: base-base interactions; boron cages; cambridge structural database; chalcogen bond; chiral thiophosphorylated thioureas; chirality control; classification of base arrangement; crystal structures; dihydrogen bonds; F...F interactions; halogen bond; hirshfeld surface; Hirshfeld surface analyzes; in situ crystallization; intermolecular interactions; knowledge-based analysis; lattice energies; lattice energy; n/a; NCI; nickel(II) complexes; organofluorine compounds; packing motifs; polymorph stability; polymorphism; QTAIM; quantum chemical calculations; Raman spectroscopy; RNA crystallographic structures; RNA structural motifs; structure-property relations; supramolecular chemistry; thermal analysis; thiazolo[2,3-b][1,3]thiazinium salts; triiodide anion; X-ray crystallography; X-ray single crystal diffraction
• Persona (resp. second.): NelyubinaYulia V; VologzhaninaAnna V
• Sommario/riassunto: Unravelling an intricate network of interatomic interactions and their relations to different behaviors of chemical compounds is key to the successful design of new materials for both existing and novel applications, from medicine to innovative concepts of molecular electronics and spintronics. X-ray crystallography has proven to be very helpful in addressing many important chemical problems in modern materials science and biosciences. Intertwined with computational techniques, it provides insights into the nature of chemical bonding and the physicochemical properties (including optical, magnetic, electrical, mechanical, and others) of crystalline materials, otherwise accessible by experimental techniques that are not so readily available to chemists. In addition to the advanced approaches in charge density analysis made possible by X-ray diffraction, the information collected over the years through this technique (which is easily mined from huge databases) has tremendous use in the design of new materials for medicine, gas storage, and separation applications as well as for electronic devices. This Special Issue contains two reviews and five articles that cover very different aspects of 'composition-structure' and 'structure-property' relations identified by X-ray diffraction and complementary techniques (from conventional IR and Raman spectroscopies to cutting-edge quantum chemical calculations) and their use in crystal engineering and materials science.
• Titolo autorizzato: Chemical Bonding in Crystals and Their Properties
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910674048503321
• Lo trovi qui: Univ. Federico II