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Terahertz metrology / / Mira Naftaly, editor



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Titolo: Terahertz metrology / / Mira Naftaly, editor Visualizza cluster
Pubblicazione: Boston : , : Artech House, , [2015]
[Piscataqay, New Jersey] : , : IEEE Xplore, , [2014]
Descrizione fisica: 1 online resource (386 p.)
Disciplina: 535.8
Soggetto topico: Terahertz spectroscopy
Metrology
Terahertz technology
Soggetto genere / forma: Electronic books.
Persona (resp. second.): NaftalyMira
Note generali: Description based upon print version of record.
Nota di bibliografia: Includes bibliographical references and index.
Nota di contenuto: Terahertz Metrology; Contents; Foreword; Introduction; 1 Terahertz Time-DomainSpectrometers; 1.1 Pulsed Terahertz Time-Domain Spectometers; 1.1.1 Principles of Operation; 1.1.2 Photoconductive Emitters and Detectors; 1.1.3 Optical Rectification; 1.1.4 Electro-Optic Detection; 1.1.5 Terahertz Air-Based Coherent Detection; 1.1.6 Cherenkov (Tilted Wavefront) Emitters and Detectors; 1.2 Continuous-Wave Terahertz Time-Domain Spectrometer and Microwave Photonics; 1.2.1 Principles and Operation; 1.2.2 Types of Continuous-Wave Terahertz Emitters and Detectors.
1.3 Time-Domain Spectrometer Configurations1.3.1 Transmission; 1.3.2 Reflection; 1.3.3 Attenuated Total Reflection; 1.3.4 Asynchronous Optical Sampling; 1.3.5 Substrate Lenses; 1.4 Commercial Systems; References; 2 Parameter Extraction in Time-DomainSpectrometers; 2.1 Introduction; 2.2 Material Properties and Wave Propagation; 2.2.1 Complex Refractive Index and Complex Permittivity.
Sommario/riassunto: This new book describes modern terahertz (THz) systems and devices and presents practical techniques for accurate measurement with an emphasis on evaluating uncertainties and identifying sources of error. This is the first THz book on the market to address measurement methodologies and issues -- perfect for practitioners and aspiring practitioners wishing to learn good measurement practice and avoid pitfalls. This book provides a brief review of different THz systems and devices, followed by chapters detailing the measurement issues encountered in using each of the main types of THz systems, and a guide to performing measurements rigorously. Particular attention is given to evaluating uncertainties, and recognizing potential sources of errors. The main focus is on time-domain spectroscopy, by far the most widely used technique. Readers are also presented with examples of applications with the emphasis on utility, both in research and in industry.
Titolo autorizzato: Terahertz metrology  Visualizza cluster
ISBN: 1-60807-777-2
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910460381903321
Lo trovi qui: Univ. Federico II
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