VLSI Design and Test : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers / / edited by S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh

• Pubblicazione: Singapore : , : Springer Singapore : , : Imprint : Springer, , 2019
• Edizione: 1st ed. 2019.
• Descrizione fisica: 1 online resource (XVIII, 722 p. 711 illus., 324 illus. in color.)
• Disciplina: 929.605
• Soggetto topico: Computer hardware; Computer organization; Computer Hardware; Computer Systems Organization and Communication Networks
• Persona (resp. second.): RajaramS; BalamuruganN.B; Gracia Nirmala RaniD; SinghVirendra
• Nota di contenuto: Digital design -- Analog and mixed signal design -- Hardware security -- Micro bio-fluidics -- VLSI testing -- Analog circuits and devices -- Network-on-chip -- Memory -- Quantum computing and NoC -- Sensors and interfaces.
• Sommario/riassunto: This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
• Titolo autorizzato: VLSI Design and Test
• ISBN: 981-13-5950-4
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910350233403321
• Lo trovi qui: Univ. Federico II
• Serie: Communications in Computer and Information Science, . 1865-0929 ; ; 892