VLSI Design and Test [[electronic resource] ] : 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers / / edited by Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma

• Pubblicazione: Singapore : , : Springer Singapore : , : Imprint : Springer, , 2019
• Edizione: 1st ed. 2019.
• Descrizione fisica: 1 online resource (XVI, 775 p. 545 illus., 336 illus. in color.)
• Disciplina: 004
• Soggetto topico: Computer hardware; Computer organization; Artificial intelligence; Computer security; Optical data processing; Mathematical logic; Computer Hardware; Computer Systems Organization and Communication Networks; Artificial Intelligence; Systems and Data Security; Image Processing and Computer Vision; Mathematical Logic and Formal Languages
• Persona (resp. second.): SenguptaAnirban; DasguptaSudeb; SinghVirendra; SharmaRohit; Kumar VishvakarmaSantosh
• Nota di contenuto: Analog and Mixed Signal Design -- Computing Architecture and Security -- Hardware Design and Optimization -- Low Power VLSI and Memory Design. -Device Modelling -- Hardware Implementation.
• Sommario/riassunto: This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
• Titolo autorizzato: VLSI Design and Test
• ISBN: 981-329-767-0
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910349286803321
• Lo trovi qui: Univ. Federico II
• Serie: Communications in Computer and Information Science, . 1865-0929 ; ; 1066