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Titolo: | Digital Forensics and Watermarking : 17th International Workshop, IWDW 2018, Jeju Island, Korea, October 22-24, 2018, Proceedings / / edited by Chang D. Yoo, Yun-Qing Shi, Hyoung Joong Kim, Alessandro Piva, Gwangsu Kim |
Pubblicazione: | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 |
Edizione: | 1st ed. 2019. |
Descrizione fisica: | 1 online resource (XI, 392 p. 167 illus., 101 illus. in color.) |
Disciplina: | 005.824 |
Soggetto topico: | Data encryption (Computer science) |
Computer security | |
Computer crimes | |
Optical data processing | |
Coding theory | |
Information theory | |
Artificial intelligence | |
Cryptology | |
Systems and Data Security | |
Computer Crime | |
Image Processing and Computer Vision | |
Coding and Information Theory | |
Artificial Intelligence | |
Persona (resp. second.): | YooChang D |
ShiYun-Qing | |
KimHyoung Joong | |
PivaAlessandro | |
KimGwangsu | |
Note generali: | Includes Index. |
Nota di contenuto: | Deep Neural Networks for Digital Forensics -- Steganalysis and Identification -- Watermarking -- Reversible Data Hiding -- Steganographic Algorithms -- Identification and Security -- Deep Generative Models for Forgery and Its Detection. |
Sommario/riassunto: | This book constitutes the refereed proceedings of the 17th International Workshop on Digital Forensics and Watermarking, IWDW 2018, held on Jeju Island, Korea, in October 2018. The 25 papers presented in this volume were carefully reviewed and selected from 43 submissions. The contributions are covering the following topics: deep neural networks for digital forensics; steganalysis and identification; watermarking; reversible data hiding; steganographic algorithms; identification and security; deep generative models for forgery and its detection. . |
Titolo autorizzato: | Digital Forensics and Watermarking |
ISBN: | 3-030-11389-2 |
Formato: | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910337582903321 |
Lo trovi qui: | Univ. Federico II |
Opac: | Controlla la disponibilità qui |