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Comparators in Nanometer CMOS Technology [[electronic resource] /] / by Bernhard Goll, Horst Zimmermann



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Autore: Goll Bernhard Visualizza persona
Titolo: Comparators in Nanometer CMOS Technology [[electronic resource] /] / by Bernhard Goll, Horst Zimmermann Visualizza cluster
Pubblicazione: Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2015
Edizione: 1st ed. 2015.
Descrizione fisica: 1 online resource (259 p.)
Disciplina: 539.7092
620
620.11
620.5
Soggetto topico: Electronic circuits
Nuclear physics
Heavy ions
Nanotechnology
Electronics
Microelectronics
Materials science
Circuits and Systems
Nuclear Physics, Heavy Ions, Hadrons
Nanotechnology and Microengineering
Electronics and Microelectronics, Instrumentation
Characterization and Evaluation of Materials
Persona (resp. second.): ZimmermannHorst
Note generali: Description based upon print version of record.
Nota di bibliografia: Includes bibliographical references and index.
Nota di contenuto: Fundamentals of clocked, regenerative comparators -- State-of-the-art nanometer CMOS -- Measurement circuits and setup -- Comparators in 120 nm CMOS -- Comparators in 65 nm CMOS -- Conclusions and comparison.
Sommario/riassunto: This book covers the complete spectrum of the fundamentals of clocked, regenerative comparators, their state-of-the-art, advanced CMOS technologies, innovative comparators inclusive circuit aspects, their characterization and properties. Starting from the basics of comparators and the transistor characteristics in nanometer CMOS, seven high-performance comparators developed by the authors in 120nm and 65nm CMOS are described extensively. Methods and measurement circuits for the characterization of advanced comparators are introduced. A synthesis of the largely differing aspects of demands on modern comparators and the properties of devices being available in nanometer CMOS, which are posed by the so-called nanometer hell of physics, is accomplished. The book summarizes the state of the art in integrated comparators. Advanced measurement circuits for characterization will be introduced as well as the method of characterization by bit-error analysis usually being used for characterization of optical receivers. The book is compact, and the graphical quality of the illustrations is outstanding. This book is written for engineers and researchers in industry as well as scientists and Ph.D students at universities. It is also recommendable to graduate students specializing on nanoelectronics and microelectronics or circuit design.
Titolo autorizzato: Comparators in Nanometer CMOS Technology  Visualizza cluster
ISBN: 3-662-44482-8
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910299695303321
Lo trovi qui: Univ. Federico II
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Serie: Springer Series in Advanced Microelectronics, . 1437-0387 ; ; 50