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Titolo: | Characterization of nanophase materials |
Pubblicazione: | [Place of publication not identified], : Wiley VCH, 2000 |
Descrizione fisica: | 1 online resource (418 pages) |
Disciplina: | 620/.5 |
Soggetto topico: | Nanostructured materials |
Nanotechnology | |
Materials Science | |
Chemical & Materials Engineering | |
Engineering & Applied Sciences | |
Soggetto genere / forma: | Electronic books. |
Persona (resp. second.): | WangZhong Lin |
Note generali: | Bibliographic Level Mode of Issuance: Monograph |
Sommario/riassunto: | Engineering of nanophase materials and devices is of vital interest in electronics, semiconductors and optics, catalysis, ceramics and magnetism. Research associated with nanoparticles has widely spread and diffused into every field of scientific research, forming a trend of nanocrystal engineered materials. The unique properties of nanophase materials are entirely determined by their atomic scale structures, particularly the structures of interfaces and surfaces. Development of nanotechnology involves several steps, of which characterization of nanoparticles is indispensable to understand the behavior and properties of nanoparticles, aiming at implementing nanotechnology, controlling their behavior and designing new nanomaterials systems with super performance. The book will focus on structural and property characterization of nanocrystals and their assemblies, with an emphasis on basic physical approach, detailed techniques, data interpretation and applications. Intended readers of this comprehensive reference work are advanced graduate students and researchers in the field, who are specialized in materials chemistry, materials physics and materials science. |
Titolo autorizzato: | Characterization of nanophase materials |
ISBN: | 1-280-55753-2 |
9786610557530 | |
3-527-60009-4 | |
Formato: | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910146053603321 |
Lo trovi qui: | Univ. Federico II |
Opac: | Controlla la disponibilità qui |