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| Titolo: |
Principles and applications of powder diffraction
|
| Pubblicazione: | [Place of publication not identified], : John Wiley and Sons Ltd, 2008 |
| Disciplina: | 548/.83 |
| Soggetto topico: | X-rays - Measurement - Diffraction |
| Powders - Optical properties | |
| Light & Optics | |
| Physics | |
| Physical Sciences & Mathematics | |
| Persona (resp. second.): | ClearfieldAbraham |
| ReibenspiesJoseph Henry | |
| BhuvaneshNattamai | |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Nota di contenuto: | An overview of powder diffraction / Lachlan M. D. Cranswick -- Intorduction to diffraction / Abraham Clearfield -- Practical aspects / Joseph H. Reibenspies and Nattamai Bhuvanesh -- Profile analysis / Arnt Kern -- Introduction to non-laboratory radiation sources / Peter J. Chupas and Karena W. Chapman -- Phase identification and quantitative methods / Pamela Whitfield and Lyndon Mitchell -- Structure solution / Armel Le Bail -- Structure refinement / James A. Kaduk -- Other topics / E. Andrew Payzant. |
| Titolo autorizzato: | Principles and applications of powder diffraction ![]() |
| ISBN: | 1-4443-0548-4 |
| 1-4443-0561-1 | |
| Formato: | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910139384203321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |