Surface and thin film analysis [[electronic resource] ] : a compendium of principles, instrumentation, and applications / / edited by Gernot Friedbacher and Henning Bubert

• Pubblicazione: Weinheim, Germany, : Wiley-VCH, 2011
• Edizione: 2nd ed.
• Descrizione fisica: 1 online resource (559 p.)
• Disciplina: 530.4275; 541.33
• Soggetto topico: Thin films - Surfaces - Analysis; Electron spectroscopy; Spectrum analysis; Pel·lícules fines; Espectroscòpia d'electrons
• Soggetto genere / forma: Llibres electrònics
• Altri autori: FriedbacherGernot BubertH (Henning)
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: pt. 1. Electron detection -- pt. 2. Ion detection -- pt. 3. Photon detection -- pt. 4. Scanning probe microscopy.
• Sommario/riassunto: Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid ref
• Titolo autorizzato: Surface and thin film analysis
• ISBN: 1-283-14094-2; 9786613140944; 3-527-63694-3; 3-527-63692-7
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910131030003321
• Lo trovi qui: Univ. Federico II