Handbook of nanoscopy [[electronic resource] /] / edited by Gustaaf van Tendeloo, Dirk Van Dyck, and Stephen J. Pennycock

• Pubblicazione: Weinheim, : Wiley-VCH, 2012
• Edizione: 1st ed.
• Descrizione fisica: 1 online resource (1449 p.)
• Disciplina: 502.82
• Soggetto topico: Microscopy; Nanotechnology
• Altri autori: TendelooG. Van (Gustaaf) Van DyckDirk PennycockStephen J
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Handbook of Nanoscopy; 33.9 Conclusions and Future Directions; Contents to Volume; Preface; List of Contributors; The Past, the Present, and the Future of Nanoscopy; Part I Methods; 1 Transmission Electron Microscopy; 1.1 Introduction; 1.2 The Instrument; 1.2.1 General Layout; 1.2.2 Lenses and Lens Aberrations; 1.3 Imaging and Diffraction Modes; 1.3.1 Important Diffraction Geometries; 1.3.2 Important Imaging Modes; 1.4 Dynamical Diffraction Theory; 1.4.1 Perfect Crystal Theory; 1.4.1.1 Fourier Space Approach; 1.4.1.2 Real-Space Approach; 1.4.1.3 Bloch Wave Approach ; 1.4.2 Example Dynamical Computations1.4.2.1 Analytical Two-Beam Solutions; 1.4.2.2 Numerical Multibeam Approaches; 1.4.2.3 Other Dynamical Scattering Phenomena; 1.4.3 Defect Images; 1.4.3.1 Theory; 1.4.3.2 Defect Image Simulations; References; 2 Atomic Resolution Electron Microscopy; 2.1 Introduction; 2.1.1 Atoms: the Alphabet of Matter; 2.1.2 The Ideal Experiment; 2.1.3 Why Imaging?; 2.1.4 Why Electron Microscopy?; 2.2 Principles of Linear Image Formation; 2.2.1 Real Imaging; 2.2.2 Coherent Imaging; 2.3 Imaging in the Electron Microscope; 2.3.1 Theory of Abbe; 2.3.2 Incoherent Effects ; 2.3.3 Imaging at Optimum Defocus: Phase Contrast Microscopy2.3.4 Resolution; 2.4 Experimental HREM; 2.4.1 Aligning the Microscope; 2.4.2 The Specimen; 2.4.3 Interpretation of the High-Resolution Images; 2.5 Quantitative HREM; 2.5.1 Model-Based Fitting; 2.5.2 Phase Retrieval; 2.5.3 Exit Wave Reconstruction; 2.5.4 Structure Retrieval: Channeling Theory; 2.5.5 Resolving versus Refining; Appendix 2.A: Interaction of the Electron with a Thin Object; Appendix 2.B: Multislice Method; Appendix 2.C: Quantum Mechanical Approach; References ; 3 Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration3.1 Introduction; 3.2 The Principles of Atomic-Resolution Imaging; 3.2.1 Resolution and Point Spread; 3.2.2 Contrast; 3.2.3 Enhanced Contrast under Negative Spherical Aberration Conditions; 3.2.4 NCSI Imaging for Higher Sample Thicknesses; 3.3 Inversion of the Imaging Process; 3.4 Case Study: SrTiO3; 3.5 Practical Examples of Application of NCSI Imaging; References; 4 Z-Contrast Imaging; 4.1 Recent Progress; 4.2 Introduction to the Instrument; 4.3 Imaging in the STEM; 4.3.1 Probe Formation ; 4.3.2 The Ronchigram4.3.3 Reciprocity between TEM and STEM; 4.3.4 Coherent and Incoherent Imaging; 4.3.5 Dynamical Diffraction; 4.3.6 Depth Sectioning; 4.3.7 Image Simulation and Quantification; 4.4 Future Outlook; Acknowledgments; References; 5 Electron Holography; General Idea; 5.1 Image-Plane Off-Axis Holography Using the Electron Biprism; 5.1.1 Recording a Hologram; 5.1.2 Reconstruction of the Electron Wave; 5.2 Properties of the Reconstructed Wave; 5.2.1 Time Averaging; 5.2.2 Inelastic Filtering; 5.2.3 Basis for Recovering the Object Exit Wave; 5.2.4 Amplitude Image; 5.2.5 Phase Image ; 5.2.6 Field of View
• Sommario/riassunto: This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the opticalto the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before goingon to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals,alloys, ceramics, polymers, semiconduc
• Titolo autorizzato: Handbook of nanoscopy
• ISBN: 3-527-64187-4; 1-283-64414-2; 3-527-64188-2; 3-527-64186-6
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910827816203321
• Lo trovi qui: Univ. Federico II