Vai al contenuto principale della pagina

2021 ACM/IEEE 3rd Workshop on Machine Learning for CAD (MLCAD) / / Institute of Electrical and Electronics Engineers



(Visualizza in formato marc)    (Visualizza in BIBFRAME)

Titolo: 2021 ACM/IEEE 3rd Workshop on Machine Learning for CAD (MLCAD) / / Institute of Electrical and Electronics Engineers Visualizza cluster
Pubblicazione: Piscataway, New Jersey : , : IEEE, , [2021]
©2021
Descrizione fisica: 1 online resource (125 pages) : illustrations
Disciplina: 620.00420285
Soggetto topico: Computer-aided design
Machine learning
Sommario/riassunto: The objective of the International Workshop on Machine Learning for CAD (MLCAD) is to provide educational and technical enrichment for Machine Learning techniques for Computer Aided Design (CAD) and to promote the state of the art advancement MLACD is a forum for an in depth technical discussion and platform for exploring new ideas and research topics with respect to topics relevant to the CAD industry ML for system level design ML approaches to logic design ML for physical design ML for analog design ML for power and thermal management ML for Design Technology Co Optimization (DTCO) ML methods to predict aging and reliability Labeled and unlabeled data in ML for CAD ML techniques for resource management in many cores ML for Verification and Validation.
Altri titoli varianti: 2021 ACM/IEEE 3rd Workshop on Machine Learning for CAD
Titolo autorizzato: 2021 ACM  Visualizza cluster
ISBN: 1-66543-166-0
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910554017203321
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui