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Comprehensive functional verification : the complete industry cycle [[electronic resource] /] / Bruce Wile, John C. Goss, Wolfgang Roesner



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Autore: Wile Bruce Visualizza persona
Titolo: Comprehensive functional verification : the complete industry cycle [[electronic resource] /] / Bruce Wile, John C. Goss, Wolfgang Roesner Visualizza cluster
Pubblicazione: Amsterdam ; ; Boston, : Elsevier/Morgan Kaufmann, c2005
Descrizione fisica: 1 online resource (702 p.)
Disciplina: 621.3815/48
Soggetto topico: Circuits integrats - Verificació
Integrated circuits - Verification
Computer engineering
Soggetto genere / forma: Electronic books.
Altri autori: GossJohn C  
RoesnerW (Wolfgang)  
Note generali: Description based upon print version of record.
Nota di bibliografia: Includes bibliographical references (p. 657-662) and index.
Nota di contenuto: Cover; Author Bios; FOREWORD; Table of contents; PREFACE; ACKNOWLEDGEMENTS; PART I: INTRODUCTION TO VERIFICATION; PART II: SIMULATION-BASED VERIFICATION; PART III: FORMAL VERIFICATION; PART IV: COMPREHENSIVE VERIFICATION; PART V: CASE STUDIES; VERIFICATION GLOSSARY; REFERENCES; SUBJECT INDEX
Sommario/riassunto: One of the biggest challenges in chip and system design is determining whether the hardware works correctly. That is the job of functional verification engineers and they are the audience for this comprehensive text from three top industry professionals.As designs increase in complexity, so has the value of verification engineers within the hardware design team. In fact, the need for skilled verification engineers has grown dramatically--functional verification now consumes between 40 and 70% of a project's labor, and about half its cost. Currently there are very few books on verificat
Titolo autorizzato: Comprehensive functional verification  Visualizza cluster
ISBN: 1-281-00839-7
9786611008390
1-4237-2233-7
9780080476643
0-08-047664-3
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910458499603321
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Serie: Systems on Silicon