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Nyquist AD Converters, Sensor Interfaces, and Robustness [[electronic resource] ] : Advances in Analog Circuit Design, 2012 / / edited by Arthur H.M. van Roermund, Andrea Baschirotto, Michiel Steyaert



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Titolo: Nyquist AD Converters, Sensor Interfaces, and Robustness [[electronic resource] ] : Advances in Analog Circuit Design, 2012 / / edited by Arthur H.M. van Roermund, Andrea Baschirotto, Michiel Steyaert Visualizza cluster
Pubblicazione: New York, NY : , : Springer New York : , : Imprint : Springer, , 2013
Edizione: 1st ed. 2013.
Descrizione fisica: 1 online resource (290 p.)
Disciplina: 621.3815
Soggetto topico: Electronic circuits
Electronics
Microelectronics
Circuits and Systems
Electronics and Microelectronics, Instrumentation
Soggetto genere / forma: Conference proceedings.
Soggetto non controllato: Engineering
Electronics
Systems engineering
Circuits and Systems
Electronics and Microelectronics, Instrumentation
Persona (resp. second.): van RoermundArthur H.M
BaschirottoAndrea
SteyaertMichiel
Note generali: Description based upon print version of record.
Nota di bibliografia: Includes bibliographical references.
Nota di contenuto: Part I: Nyquist A/D Converters -- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes -- Dual Residue Pipeline ADC -- Time-Interleaved SAR and Slope Converters -- GS/s AD Conversion for Broadband Multi-Stream Reception -- CMOS Ultra High-Speed Time-Interleaved ADCs -- CMOS ADCs for Optical Communications -- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow -- Energy-Efficient Capacitive Sensor Interfaces -- Interface Circuits for MEMS Microphones -- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments -- Part III: Robustness -- How Can Chips Live Under Radiation? -- TDC and Rad Environments -- Matching and Resolution -- Matching in Polymer and Effect on Circuit Topologies -- Statistical Variability and Reliability in Nano-CMOS Transistors.
Sommario/riassunto: This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design.  Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity.  This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.  Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia; Presents material in a tutorial-based format; Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
Titolo autorizzato: Nyquist AD Converters, Sensor Interfaces, and Robustness  Visualizza cluster
ISBN: 1-283-86498-3
1-4614-4587-6
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910437919203321
Lo trovi qui: Univ. Federico II
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