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Titolo: |
Nyquist AD Converters, Sensor Interfaces, and Robustness [[electronic resource] ] : Advances in Analog Circuit Design, 2012 / / edited by Arthur H.M. van Roermund, Andrea Baschirotto, Michiel Steyaert
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Pubblicazione: | New York, NY : , : Springer New York : , : Imprint : Springer, , 2013 |
Edizione: | 1st ed. 2013. |
Descrizione fisica: | 1 online resource (290 p.) |
Disciplina: | 621.3815 |
Soggetto topico: | Electronic circuits |
Electronics | |
Microelectronics | |
Circuits and Systems | |
Electronics and Microelectronics, Instrumentation | |
Soggetto genere / forma: | Conference proceedings. |
Soggetto non controllato: | Engineering |
Electronics | |
Systems engineering | |
Circuits and Systems | |
Electronics and Microelectronics, Instrumentation | |
Persona (resp. second.): | van RoermundArthur H.M |
BaschirottoAndrea | |
SteyaertMichiel | |
Note generali: | Description based upon print version of record. |
Nota di bibliografia: | Includes bibliographical references. |
Nota di contenuto: | Part I: Nyquist A/D Converters -- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes -- Dual Residue Pipeline ADC -- Time-Interleaved SAR and Slope Converters -- GS/s AD Conversion for Broadband Multi-Stream Reception -- CMOS Ultra High-Speed Time-Interleaved ADCs -- CMOS ADCs for Optical Communications -- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow -- Energy-Efficient Capacitive Sensor Interfaces -- Interface Circuits for MEMS Microphones -- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments -- Part III: Robustness -- How Can Chips Live Under Radiation? -- TDC and Rad Environments -- Matching and Resolution -- Matching in Polymer and Effect on Circuit Topologies -- Statistical Variability and Reliability in Nano-CMOS Transistors. |
Sommario/riassunto: | This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development. Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia; Presents material in a tutorial-based format; Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity. |
Titolo autorizzato: | Nyquist AD Converters, Sensor Interfaces, and Robustness ![]() |
ISBN: | 1-283-86498-3 |
1-4614-4587-6 | |
Formato: | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910437919203321 |
Lo trovi qui: | Univ. Federico II |
Opac: | Controlla la disponibilità qui |