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IEEE Std C37.26-2014 (Revision of IEEE Std C37.26-2003) : IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits / / IEEE



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Titolo: IEEE Std C37.26-2014 (Revision of IEEE Std C37.26-2003) : IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits / / IEEE Visualizza cluster
Pubblicazione: New York : , : IEEE, , 2014
Descrizione fisica: 1 online resource (ix, 10 pages)
Disciplina: 621.3192
Soggetto topico: Electric circuits - Standards
Sommario/riassunto: Methods for determining the value of the power factor for inductive low-voltage (1000 V ac and lower) test circuits are provided. These methods are used in determining the power factor during short-circuit current tests in high-power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used shall have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 V ac) but may also be used for higher voltages. Keywords: IEEE C37.26, inductive test circuits, power factor.
Altri titoli varianti: C37.26-2014 - IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage
IEEE Std C37.26-2014 (Revision of IEEE Std C37.26-2003): IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits
IEEE Std C37.26-2014
IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage
Titolo autorizzato: IEEE Std C37.26-2014 (Revision of IEEE Std C37.26-2003)  Visualizza cluster
ISBN: 0-7381-9326-7
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910135300303321
Lo trovi qui: Univ. Federico II
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