5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California

• Pubblicazione: [Place of publication not identified], : IEEE Computer Society, 2004
• Soggetto topico: Integrated circuits - Very large scale integration - Reliability; Integrated circuits - Very large scale integration - Design and construction; Integrated circuits - Computer-aided design - Very large scale integration; Integrated circuits - Quality control - Very large scale integration - Testing; Electrical & Computer Engineering; Engineering & Applied Sciences; Electrical Engineering
• Note generali: Bibliographic Level Mode of Issuance: Monograph
• Titolo autorizzato: 5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910872691203321
• Lo trovi qui: Univ. Federico II