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Titolo: | Principles and applications of powder diffraction |
Pubblicazione: | [Place of publication not identified], : John Wiley and Sons Ltd, 2008 |
Disciplina: | 548/.83 |
Soggetto topico: | X-rays - Measurement - Diffraction |
Powders - Optical properties | |
Light & Optics | |
Physics | |
Physical Sciences & Mathematics | |
Persona (resp. second.): | ClearfieldAbraham |
ReibenspiesJoseph Henry | |
BhuvaneshNattamai | |
Note generali: | Bibliographic Level Mode of Issuance: Monograph |
Nota di contenuto: | An overview of powder diffraction / Lachlan M. D. Cranswick -- Intorduction to diffraction / Abraham Clearfield -- Practical aspects / Joseph H. Reibenspies and Nattamai Bhuvanesh -- Profile analysis / Arnt Kern -- Introduction to non-laboratory radiation sources / Peter J. Chupas and Karena W. Chapman -- Phase identification and quantitative methods / Pamela Whitfield and Lyndon Mitchell -- Structure solution / Armel Le Bail -- Structure refinement / James A. Kaduk -- Other topics / E. Andrew Payzant. |
Titolo autorizzato: | Principles and applications of powder diffraction |
ISBN: | 1-4443-0548-4 |
1-4443-0561-1 | |
Formato: | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910830482903321 |
Lo trovi qui: | Univ. Federico II |
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