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Titolo: | System level ESD co-design / / edited by Charvaka Duvvury, Harald Gossner |
Pubblicazione: | West Sussex, England : , : Wiley-IEEE Press, , 2015 |
©2015 | |
Descrizione fisica: | 1 online resource (533 p.) |
Disciplina: | 537/.2 |
Soggetto topico: | Shielding (Electricity) |
Electronic apparatus and appliances - Design and construction | |
Integrated circuits - Design and construction | |
Integrated circuits - Protection | |
Electrostatics | |
Static eliminators | |
Classificazione: | TEC031000 |
Persona (resp. second.): | DuvvuryCharvaka |
GossnerHarald | |
Note generali: | Description based upon print version of record. |
Nota di bibliografia: | Includes bibliographical references and index. |
Nota di contenuto: | Machine generated contents note: Chapter 1 Introduction Charvaka Duvvury Chapter 2 Component Versus System Level ESD Charvaka Duvvury and Harald Gossner Chapter 3 System Level Testing for ESD Susceptibility Michael Hopkins Chapter 4 PCB/IC Co-Design Concepts for SEED Harald Gossner and Charvaka Duvvury Chapter 5 Hard Fails & PCB Protection Devices Robert Ashton Chapter 6 Soft Fail and PCB design measures David Pommerenke and Pratik Maheshwari Chapter 7 ESD in Mobile Devices Matti Uusimaki Chapter 8 ESD for Automotive Applications Wolfgang Reinprecht Chapter 9 Futire Applications of SEED Methodology Harald Gossner and Charvaka Duvvury Chapter 10 Co-Design Tradeoffs: Balancing Robustness, Performance and Cost Jeffery C. Dunnihoo Index . |
Sommario/riassunto: | "Demystifies the concept of system-level ESD and details its difference from the conventional component level ESD design and testing. Describes the protection elements and designs and focuses on the "co-design", an optimization methodology to address both issues in the same design space"-- |
Titolo autorizzato: | System level ESD co-design |
ISBN: | 1-118-86188-4 |
1-118-86184-1 | |
9781118861899 | |
Formato: | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910807341103321 |
Lo trovi qui: | Univ. Federico II |
Opac: | Controlla la disponibilità qui |