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Analysis of piezoelectric devices [[electronic resource] /] / Jiashi Yang



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Autore: Yang Jiashi <1956-> Visualizza persona
Titolo: Analysis of piezoelectric devices [[electronic resource] /] / Jiashi Yang Visualizza cluster
Pubblicazione: Hackensack, NJ, : World Scientific, c2006
Descrizione fisica: xv, 520 p. : ill
Disciplina: 537/.2446
Soggetto topico: Piezoelectric devices - Mathematical models
Note generali: Title from title screen.
Nota di bibliografia: Includes bibliographical references (p. 491-500) and index.
Nota di contenuto: ch. 1. Three-dimensional theories. 1.1. Nonlinear electroelasticity for strong fields. 1.2. Linear piezoelectricity for infinitesimal fields. 1.3. Linear theory for small fields superposed on a finite bias. 1.4. Cubic theory for weak nonlinearity -- ch. 2. Thickness-shear modes of plate resonators. 2.1. Static thickness-shear deformation. 2.2. Nonlinear thickness-shear deformation. 2.3. Effects of initial fields on thickness-shear deformation. 2.4. Linear thickness-shear vibration. 2.5. Effects of electrode inertia. 2.6. Inertial effects of imperfectly bounded electrodes. 2.7. Effects of electrode inertia and shear stiffness. 2.8. Nonlinear thickness-shear vibration. 2.9. Effects of initial fields on thickness-shear vibration -- ch. 3. Slowly varying thickness-shear modes. 3.1. Exact waves in a plate. 3.2. An approximate equation for thickness-shear waves. 3.3. Thickness-shear vibration of finite plates. 3.4. Energy trapping in mesa resonators. 3.5. Contoured resonators. 3.6. Energy trapping due to material inhomogeneity. 3.7. Energy trapping by electrode mass. 3.8. Effects of non-uniform electrodes. 3.9. Effectsof electromechanical coupling on energy trapping. 3.10. Coupling to flexure. 3.11. Coupling to face-shear and flexure. 3.12. Effects of middle surface curvature -- ch. 4. Mass sensors. 4.1. Inertial effect of a mass layer by perturbation. 4.2. Thickness-shear modes of a plate. 4.3. Anti-plane modes of a wedge. 4.4. Torsional modes of a conical shell. 4.5. Effects of inertia and stiffness of a mass layer by perturbation. 4.6. Effects of inertia and stiffness of a mass layer by variation. 4.7. Radial modes of a ring. 4.8. Effects of shear deformability ofa mass layer. 4.9. Thickness-shear modes ofa plate with thick mass layers. 4.10. An ill-posed problem in elasticity for mass sensors. 4.11. Thickness-shear modes of a circular cylinder. 4.12. Mass sensitivity of surface waves. 4.13. Thickness-twist waves in a ceramic plate. 4.14. Bechmann's number for thickness-twist waves. 4.15. Thickness-twist waves in a quartz plate -- ch. 5. Fluid sensors. 5.1. An ill-posed problem in elasticity for fluid sensors. 5.2. Perturbation analysis. 5.3. Thickness-shear modes of a plate. 5.4. Torsional modes of a cylindrical shell. 5.5. Thickness-shear modes of a circular cylinder. 5.6. Surface wave fluid sensors. 5.7. Thickness-twist waves in a ceramic plate -- ch. 6. Gyroscopes - frequency effect. 6.1. High frequency vibrations of a small rotating piezoelectric body. 6.2. Propagation of plane waves. 6.3. Thickness vibrations of plates. 6.4. Propagating waves in a rotating piezoelectric plate. 6.5. Surface waves over a rotating piezoelectric half-space -- ch. 7. Gyroscopes - charge effect. 7.1. A rectangular beam. 7.2. A circular tube. 7.3. A beam bimorph. 7.4. An inhomogeneous shell. 7.5. A ceramic ring. 7.6. A concentrated mass and ceramic rods. 7.7. A ceramic plate by two-dimensional equations. 7.8. A ceramic plate by zero-dimensional equations -- ch. 8. Acceleration sensitivity. 8.1. Deformation of a quartz plate under normal acceleration. 8.2. First-order acceleration sensitivity. 8.3. An estimate of second-order acceleration sensitivity and its reduction. 8.4. Second-order perturbation analysis. 8.5. Second-order normal acceleration sensitivity. 8.6. Effects of middle surface curvature. 8.7. Vibration sensitivity -- ch. 9. Pressure sensors. 9.1. A rectangular plate in a circular cylindrical shell. 9.2. A circular plate in a circular cylindrical shell. 9.3. A rectangular plate in a shallow shell. 9.4. A bimorph. 9.5. Surface wave pressure sensors based on extension. 9.6. Surface wave pressure sensors based on flexure -- ch. 10. Temperature sensors. 10.1. Thermoelectroelasticity. 10.2. Linear theory. 10.3. Small fields superposed on a thermal bias. 10.4. Thickness-shear modes of a free plate. 10.5. Thickness-shear modes of a constrained plate -- ch. 11. Piezoelectric generators. 11.1. Thickness-stretch of a ceramic plate. 11.2. A circular shell. 11.3. A beam bimorph. 11.4. A spiral bimorph. 11.5. Nonlinear behavior near resonance -- ch. 12. Piezoelectric transformers. 12.1. A thickness-stretch mode plate transformer. 12.2. Rosen transformer. 12.3. A thickness-shear mode transformer - free vibration. 12.4. A thickness-shear mode transformer - forced vibration -- ch. 13. Power transmissiion through an elastic wall. 13.1. Formulation of the problem. 13.2. Theoretical analysis. 13.3. Numerical results -- ch. 14. Acoustic wave amplifiers. 14.1. Equations for piezoelectric semiconductors. 14.2. Equations for a thin film. 14.3. Surface waves. 14.4. Interface waves. 14.5. Waves in a plate. 14.6. Gap waves.
Titolo autorizzato: Analysis of piezoelectric devices  Visualizza cluster
ISBN: 1-281-37307-9
9786611373078
981-277-318-5
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910784722203321
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