Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / / Takeo Oku
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| Autore: |
Oku Takeo
|
| Titolo: |
Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / / Takeo Oku
|
| Pubblicazione: | Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2014 |
| ©2014 | |
| Descrizione fisica: | 1 online resource (180 p.) |
| Disciplina: | 502.825 |
| Soggetto topico: | Transmission electron microscopy |
| High resolution electron microscopy | |
| Nanostructured materials | |
| Structural analysis (Engineering) | |
| Soggetto genere / forma: | Electronic books. |
| Note generali: | Description based upon print version of record. |
| Nota di bibliografia: | Includes bibliographical references at the end of each chapters and index. |
| Nota di contenuto: | Front matter -- Preface -- Contents -- 1 Introduction -- 2 Structure and principle of electron microscopes -- 3 Practice of HREM -- 4 Characterization by HREM -- 5 Electron diffraction analysis of nanostructured materials -- 6 HREM analysis of nanostructured materials -- A Appendix -- Index |
| Sommario/riassunto: | High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes. |
| Titolo autorizzato: | Structure analysis of advanced nanomaterials |
| ISBN: | 1-5231-0054-0 |
| 3-11-038804-9 | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910463816503321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |