Spectroscopic Ellipsometry for Photovoltaics : Volume 2: Applications and Optical Data of Solar Cell Materials / / edited by Hiroyuki Fujiwara, Robert W. Collins

• Pubblicazione: Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018
• Edizione: 1st ed. 2018.
• Descrizione fisica: 1 online resource (XXI, 616 p. 330 illus., 204 illus. in color.)
• Disciplina: 620.11295
• Soggetto topico: Lasers; Photonics; Optical materials; Electronic materials; Spectroscopy; Microscopy; Renewable energy resources; Microwaves; Optical engineering; Optics, Lasers, Photonics, Optical Devices; Optical and Electronic Materials; Spectroscopy and Microscopy; Renewable and Green Energy; Microwaves, RF and Optical Engineering
• Persona (resp. second.): FujiwaraHiroyuki; CollinsRobert W
• Note generali: Includes index.
• Nota di contenuto: Introduction -- Part I: Application of Ellipsometry Technique -- Analysis of Optical and Recombination Losses in Solar Cells -- Optical Simulation of External Quantum Efficiency Spectra -- Characterization of Textured Structures -- On-line Monitoring of Photovoltaics Production -- Real Time Measurement, Monitoring, and Control of CuIn1‑xGaxSe2 by Spectroscopic Ellipsometry -- Real Time and Mapping Spectroscopic Ellipsometry of Hydrogenated Amorphous and Nanocrystalline Si Solar Cells -- Part II: Optical Data of Solar-Cell Component Materials -- Inorganic Semiconductors and Passivation Layers -- Organic Semiconductors -- Organic-Inorganic Hybrid Perovskites -- Transparent Conductive Oxides -- Metals -- Substrates and Coating Layers.
• Sommario/riassunto: Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.
• Titolo autorizzato: Spectroscopic Ellipsometry for Photovoltaics
• ISBN: 3-319-95138-6
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910309661803321
• Lo trovi qui: Univ. Federico II
• Serie: Springer Series in Optical Sciences, . 0342-4111 ; ; 214