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Transmission electron microscopy characterization of nanomaterials / / Challa S.S.R. Kumar, editor



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Titolo: Transmission electron microscopy characterization of nanomaterials / / Challa S.S.R. Kumar, editor Visualizza cluster
Pubblicazione: Heidelberg [Germany] : , : Springer, , 2014
Edizione: 1st ed. 2014.
Descrizione fisica: 1 online resource (ix, 716 pages) : illustrations (some color)
Disciplina: 620.115
Soggetto topico: Nanostructured materials
Nanotechnology
Persona (resp. second.): KumarC. S. S. R (Challa S. S. R.)
Note generali: Includes index.
Nota di bibliografia: Includes bibliographical references and index.
Nota di contenuto: TEM Characterization of Biological and Inorganic Nanocomposites -- Electron Microscopy of Thin Film Inorganic and Organic Photovoltaic Materials -- TEM for Characterization of Semiconductor Nanomaterials -- Study of Polymeric Nano-Composites by 3D-TEM and Related Techniques.-TEM for Characterization of Nanowires and Nanorods -- TEM for Characterization of Core-Shell Nanomaterials -- Valence Electron Spectroscopy by Transmission Electron Microscopy -- TEM Characterization of Nanocomposite Materials -- High Resolution in STEM Mode: Individual Atom Analysis in Semiconductor Nanowires -- Electron Microscopy for Characterization of Thermoelectric Nanomaterials -- TEM for Characterization of Nanocomposites Oxide Thin Films: A Case Study on Solution-Derived Lanthanum Strontium Manganites -- TEM Characterization of Metallic Nanocatalysts -- 3D Electron Microscopy Applied to Nanoscience.-Transmission Electron Microscopy of 1D-Nanostructures.
Sommario/riassunto: Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Titolo autorizzato: Transmission Electron Microscopy Characterization of Nanomaterials  Visualizza cluster
ISBN: 3-642-38934-1
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910298461803321
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