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Principles and applications of powder diffraction



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Titolo: Principles and applications of powder diffraction Visualizza cluster
Pubblicazione: [Place of publication not identified], : John Wiley and Sons Ltd, 2008
Disciplina: 548/.83
Soggetto topico: X-rays - Measurement - Diffraction
Powders - Optical properties
Light & Optics
Physics
Physical Sciences & Mathematics
Persona (resp. second.): ClearfieldAbraham
ReibenspiesJoseph Henry
BhuvaneshNattamai
Note generali: Bibliographic Level Mode of Issuance: Monograph
Nota di contenuto: An overview of powder diffraction / Lachlan M. D. Cranswick -- Intorduction to diffraction / Abraham Clearfield -- Practical aspects / Joseph H. Reibenspies and Nattamai Bhuvanesh -- Profile analysis / Arnt Kern -- Introduction to non-laboratory radiation sources / Peter J. Chupas and Karena W. Chapman -- Phase identification and quantitative methods / Pamela Whitfield and Lyndon Mitchell -- Structure solution / Armel Le Bail -- Structure refinement / James A. Kaduk -- Other topics / E. Andrew Payzant.
Titolo autorizzato: Principles and applications of powder diffraction  Visualizza cluster
ISBN: 1-4443-0548-4
1-4443-0561-1
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910139384203321
Lo trovi qui: Univ. Federico II
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