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| Titolo: |
2015 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD) : IEEE ASEMD 2015 proceedings : 20-23 November 2015, Shanghai, China / / Institute of Electrical and Electronics Engineers Beijing Section, International Conference on Applied Superconductivity and Electromagnetic Devices
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| Pubblicazione: | Piscataway, NJ : , : IEEE, , 2015 |
| Descrizione fisica: | 1 online resource (51, 622 pages) : illustrations |
| Disciplina: | 621.3 |
| Soggetto topico: | Electromagnetic devices |
| Nota di bibliografia: | Includes bibliographical references. |
| Sommario/riassunto: | Annotation International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD2015) will be held from 20 to 23 November 2015 in Shanghai, sponsored by IEEE Beijing Section. ASEMD2015 continues the focus on the applied superconductivity and electromagnetic devices. It provides a forum for both university and industry academic researchers and experts in the relevant fields to discuss and share ideas, present results, reflect on past experiences and discuss future developments. The accepted conference papers will be uploaded to the IEEE Xplore and EI indexed. The scope of the conference includes principally the following topics Strong Current and Large Scale Applied Superconductivity Superconducting Electronics Superconducting Materials Electromagnetic Materials Electromagnetic Devices Electric Power Devices Electrical Machines Energy Efficiency Devices Power Electronic Devices and Circuits Mechatronics Control and Measurement Computing and Informatics. |
| Altri titoli varianti: | 2015 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices |
| Titolo autorizzato: | 2015 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD) ![]() |
| ISBN: | 1-4673-8107-1 |
| Formato: | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910136789503321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |