Next-Generation Applied Intelligence [Risorsa elettronica] : 22nd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2009, Tainan, Taiwan, June 24-27, 2009. Proceedings / edited by David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Randy Goebel, Jörg Siekmann, Wolfgang Wahlster, Been-Chian Chien, Tzung-Pei Hong, Shyi-Ming Chen, Moonis Ali

• Pubblicazione: Berlin ; Heidelberg : Springer, 2009
• Persona (resp. second.): Ali, Moonis; Chen, Shyi-Ming; Chien, Been-Chian; Goebel, Randy; Hong, Tzung-Pei; Hutchison, David; Kanade, Takeo; Kittler, Josef; Kleinberg, Jon M.; Mattern, Friedemann; Mitchell, John C.; Naor, Moni; Nierstrasz, Oscar; Pandu Rangan, C.; Siekmann, Jörg; Steffen, Bernhard; Sudan, Madhu; Terzopoulos, Demetri; Tygar, Doug; Vardi, Moshe Y.; Wahlster, Wolfgang; Weikum, Gerhard
• Type File/ Data Note: Formato html, pdf
• Requisiti sistema: Formato html, pdf
• Titolo autorizzato: Next-Generation Applied Intelligence
• ISBN: 9783642025686
• Formato: Risorse elettroniche
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 990009261020403321
• Lo trovi qui: Univ. Federico II
• Localizzazioni e accesso elettronico: http://dx.doi.org/10.1007/978-3-642-02568-6