Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials [[electronic resource] /] / by Y. Waseda

• Autore: Waseda Y
• Pubblicazione: Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1984
• Edizione: 1st ed. 1984.
• Descrizione fisica: 1 online resource (vi, 183 p. ) : ill.
• Disciplina: 548
• Soggetto topico: Crystallography; Mineralogy; Materials science; Crystallography and Scattering Methods; Materials Science, general
• Note generali: Includes index.
• Nota di bibliografia: Bibliography: p. [170]-177.
• Nota di contenuto: A brief background of the present requirement for structural characterization of disordered materials -- Fundamental relationships between rdf and scattering intensity -- Definition of partial structure factors and compositional short range order (CSRO) -- Experimental determination of partial structural functions -- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials -- Theoretical aspects on the anomalous dispersion factors of x-rays -- Experimental determination of the anomalous dispersion factors -- Selected examples of structural determination using anomalous (resonance) x-ray scattering -- Relative merits of anomalous x-ray scattering and its future prospects.
• Titolo autorizzato: Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials
• ISBN: 3-540-38910-5
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 996466834003316
• Lo trovi qui: Univ. di Salerno
• Serie: Lecture Notes in Physics, . 0075-8450 ; ; 204