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Introduction to scanning tunneling microscopy / / C. Julian Chen



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Autore: Chen C. Julian Visualizza persona
Titolo: Introduction to scanning tunneling microscopy / / C. Julian Chen Visualizza cluster
Pubblicazione: New York, : Oxford University Press, 1993
Edizione: 1st ed.
Descrizione fisica: 1 online resource (469 p.)
Disciplina: 502/.8/2
Soggetto topico: Scanning tunneling microscopy
Microscopy
Note generali: Previously issued in print: 1993.
Nota di bibliografia: Includes bibliographical references (p. 383-404) and index.
Nota di contenuto: Contents; List of Figures; Gallery of STM Images; 1 Overview; PART I: IMAGING MECHANISM; PART II : INSTRUMENTATION; Appendix A: Real wavefunctions; Appendix B: Green's functions; Appendix C: Spherical modified Bessel functions; Appendix D: Two-dimensional Fourier series; Appendix E: Plane groups and invariant functions; Appendix F: Elementary elasticity theory; Appendix G: A short table of Laplace transforms; Appendix H: Operational amplifiers; References; Index
Sommario/riassunto: A graduate-level introduction to scanning tunnelling microscopy, which explains how the method's ability to map microscopic surfaces non-destructively has found major applications in physics, surface science, materials science, biology, chemistry and engineering.
Titolo autorizzato: Introduction to scanning tunneling microscopy  Visualizza cluster
ISBN: 0-19-773239-9
0-19-802356-1
1-4237-6461-7
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910809771503321
Lo trovi qui: Univ. Federico II
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Serie: Oxford series in optical and imaging sciences ; ; 4.