Resonant X-Ray Scattering in Correlated Systems [[electronic resource] /] / edited by Youichi Murakami, Sumio Ishihara
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| Titolo: |
Resonant X-Ray Scattering in Correlated Systems [[electronic resource] /] / edited by Youichi Murakami, Sumio Ishihara
|
| Pubblicazione: | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2017 |
| Edizione: | 1st ed. 2017. |
| Descrizione fisica: | 1 online resource (VII, 241 p. 151 illus., 25 illus. in color.) |
| Disciplina: | 539.7222 |
| Soggetto topico: | Condensed matter |
| Materials science | |
| Spectroscopy | |
| Microscopy | |
| Nanotechnology | |
| Condensed Matter Physics | |
| Characterization and Evaluation of Materials | |
| Spectroscopy and Microscopy | |
| Nanotechnology and Microengineering | |
| Persona (resp. second.): | MurakamiYouichi |
| IshiharaSumio | |
| Nota di contenuto: | Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara) -- Resonant X-ray scattering in 3d electron systems (H. Nakao) -- Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura) -- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima) -- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati) -- Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii). |
| Sommario/riassunto: | The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown. |
| Titolo autorizzato: | Resonant X-Ray Scattering in Correlated Systems |
| ISBN: | 3-662-53227-1 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910254603303321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |
Serie:
Springer Tracts in Modern Physics, . 0081-3869 ; ; 269