2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers (IEEE)
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| Titolo: |
2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers (IEEE)
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| Pubblicazione: | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 |
| Descrizione fisica: | 1 online resource (various paging) : illustrations some color |
| Disciplina: | 621.38152 |
| Soggetto topico: | Semiconductors - Cooling |
| Semiconductors - Thermal properties | |
| Sommario/riassunto: | SEMI THERM provides a forum for engineers, academics, and executives to learn, exchange ideas, and display the latest in thermal management techniques, products and services Attendees include anyone interested in thermal design, management and characterization of electronic systems and components. |
| Altri titoli varianti: | 2017 33rd Thermal Measurement, Modeling & Management Symposium |
| Titolo autorizzato: | 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) |
| ISBN: | 1-5386-1531-2 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910172623503321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |