Titolo: |
Ellipsometry of Functional Organic Surfaces and Films / Karsten Hinrichs, Klaus-Jochen Eichhorn editors
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Pubblicazione: |
Cham, : Springer, 2018 |
Titolo uniforme: |
Ellipsometry of Functional Organic Surfaces and Films
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Edizione: |
2. ed |
Descrizione fisica: |
xxvi, 547 p. : ill. ; 24 cm |
Soggetto topico: |
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020] |
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74K35 - Thin films [MSC 2020] |
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78A60 - Lasers, masers, optical bistability, nonlinear optics [MSC 2020] |
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92Exx - Chemistry [MSC 2020] |
Soggetto non controllato: |
Biomolecules at Surfaces |
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Characterization of Organic Semiconductors |
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Ellipsometric Real-time/In-situ Monitoring Techniques |
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Functional and Smart Films |
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In-Situ Monitoring Techniques |
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Infrared Brillant Light Sources for Micro-ellipsometric Studies |
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Microscopic and imaging ellipsometry |
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OLEDs and OTFT |
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Optical Constants of Organic Layers |
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Organic and Hybrid Materials |
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Smart Polymer Surfaces and Films |
Persona (resp. second.): |
Eichhorn, Klaus-Jochen |
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Hinrichs, Karsten |
Titolo autorizzato: |
Ellipsometry of Functional Organic Surfaces and Films |
Formato: |
Materiale a stampa |
Livello bibliografico |
Monografia |
Lingua di pubblicazione: |
Inglese |
Record Nr.: | VAN00208486 |
Lo trovi qui: | Univ. Vanvitelli |
Localizzazioni e accesso elettronico |
http://doi.org/10.1007/978-3-319-75895-4 |
Opac: |
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