The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing
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| Titolo: |
The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing
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| Pubblicazione: | New York : , : IEEE, , 2008 |
| Descrizione fisica: | 1 online resource (xxxi, 545 pages) |
| Soggetto topico: | Integrated circuits - Very large scale integration - Design and construction |
| Fault-tolerant computing | |
| Persona (resp. second.): | BolchiniCristiana |
| KimYong-Bin | |
| GizopoulosDimitris | |
| TehranipoorMohammad H. <1974-> | |
| Note generali: | Includes index. |
| Titolo autorizzato: | The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems |
| ISBN: | 1-5090-8441-X |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910145668103321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |