Prognostics and health management of electronics [[electronic resource] /] / Michael G. Pecht

• Autore: Pecht Michael
• Pubblicazione: Hoboken, N.J., : Wiley, c2008
• Descrizione fisica: 1 online resource (335 p.)
• Disciplina: 621.381; 621.381028/8
• Soggetto topico: Electronic systems - Maintenance and repair
• Soggetto genere / forma: Electronic books.
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Prognostics and Health Management of Electronics; Contents; Preface; Acknowledgements; Acronyms; Chapter 1 Introduction; 1.1 Reliability and Prognostics; 1.2 PHM for Electronics; 1.3 PHM Concepts and Methods; 1.3.1 Fuses and Canaries; 1.3.2 Monitoring and Reasoning of Failure Precursors; 1.3.3 Monitoring Environmental and Usage Profiles for Damage Modeling; 1.4 Implementation of PHM for System of Systems; 1.5 Summary; Chapter 2 Sensor Systems for PHM; 2.1 Sensor and Sensing Principles; 2.1.1 Thermal Sensors; 2.1.2 Electrical Sensors; 2.1.3 Mechanical Sensors; 2.1.4 Humidity Sensors ; 2.1.5 Biosensors2.1.6 Chemical Sensors; 2.1.7 Optical Sensors; 2.1.8 Magnetic Sensors; 2.2 Sensor Systems for PHM; 2.2.1 Parameters to Be Monitored; 2.2.2 Sensor System Performance; 2.2.3 Physical Attributes of Sensor Systems; 2.2.4 Functional Attributes of Sensor Systems; 2.2.5 Cost; 2.2.6 Reliability; 2.2.7 Availability; 2.3 Sensor Selection; 2.4 Examples of Sensor Systems for PHM Implementation; 2.5 Emerging Trends in Sensor Technology for PHM; Chapter 3 Data-Driven Approaches for PHM; 3.1 Introduction; 3.2 Parametric Statistical Methods; 3.2.1 Likelihood Ratio Test ; 3.2.2 Maximum Likelihood Estimation3.2.3 Neyman-Pearson Criterion; 3.2.4 Expectation Maximization; 3.2.5 Minimum Mean Square Error Estimation; 3.2.6 Maximum A Posteriori Estimation; 3.2.7 Rao-Blackwell Estimation; 3.2.8 Cramer-Rao Lower Bound; 3.3 Nonparametric Statistical Methods; 3.3.1 Nearest Neighbor-Based Classification; 3.3.2 Parzen Window (or Kernel Density Estimation); 3.3.3 Wilcoxon Rank-Sum Test; 3.3.4 Kolmogorov-Smirnov Test; 3.3.5 Chi Square Test; 3.4 Machine Learning Techniques; 3.5 Supervised Classification; 3.5.1 Discriminative Approach; 3.5.2 Generative Approach ; 3.6 Unsupervised Classification3.6.1 Discriminative Approach; 3.6.2 Generative Approach; 3.7 Summary; Chapter 4 Physics-of-Failure Approach to PHM; 4.1 PoF-Based PHM Methodology; 4.2 Hardware Configuration; 4.3 Loads; 4.4 Failure Modes, Mechanisms, and Effects Analysis; 4.5 Stress Analysis; 4.6 Reliability Assessment and Remaining-Life Predictions; 4.7 Outputs from PoF-Based PHM; Chapter 5 The Economics of PHM; 5.1 Return on Investment; 5.1.1 PHM ROI Analyses; 5.1.2 Financial Costs; 5.2 PHM Cost-Modeling Terminology and Definitions; 5.3 PHM Implementation Costs; 5.3.1 Nonrecurring Costs ; 5.3.2 Recurring Costs5.3.3 Infrastructure Costs; 5.3.4 Nonmonetary Considerations and Maintenance Culture; 5.4 Cost Avoidance; 5.4.1 Maintenance Planning Cost Avoidance; 5.4.2 Discrete Event Simulation Maintenance Planning Model; 5.4.3 Fixed-Schedule Maintenance Interval; 5.4.4 Precursor to Failure Monitoring; 5.4.5 LRU-Independent Methods; 5.4.6 Discrete Event Simulation Implementation Details; 5.4.7 Operational Profile; 5.5 Example PHM Cost Analysis; 5.5.1 Single-Socket Model Results; 5.5.2 Multiple-Socket Model Results; 5.5.3 Example Business Case Construction; 5.6 Summary ; Chapter 6 PHM Roadmap: Challenges and Opportunities
• Sommario/riassunto: The first book on Prognostics and Health Management of Electronics Recently, the field of prognostics for electronic products has received increased attention due to the potential to provide early warning of system failures, forecast maintenance as needed, and reduce life cycle costs. In response to the subject's growing interest among industry, government, and academic professionals, this book provides a road map to the current challenges and opportunities for research and development in Prognostics and Health Management (PHM). The book begins with a review of PHM and the techniques being
• Titolo autorizzato: Prognostics and health management of electronics
• ISBN: 1-281-81459-8; 9786611814595; 0-470-38584-7; 0-470-38583-9
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910144128903321
• Lo trovi qui: Univ. Federico II