Automated Technology for Verification and Analysis [Risorsa elettronica] : 6th International Symposium, ATVA 2008, Seoul, Korea, October 20-23, 2008. Proceedings / edited by David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Sungdeok (Steve) Cha, Jin-Young Choi, Moonzoo Kim, Insup Lee, Mahesh Viswanathan

• Pubblicazione: Berlin ; Heidelberg : Springer, 2008
• Persona (resp. second.): Cha, Sungdeok (Steve); Choi, Jin-Young; Hutchison, David; Kanade, Takeo; Kim, Moonzoo; Kittler, Josef; Kleinberg, Jon M.; Lee, Insup; Mattern, Friedemann; Mitchell, John C.; Naor, Moni; Nierstrasz, Oscar; Pandu Rangan, C.; Steffen, Bernhard; Sudan, Madhu; Terzopoulos, Demetri; Tygar, Doug; Vardi, Moshe Y.; Viswanathan, Mahesh; Weikum, Gerhard
• Type File/ Data Note: Formato html, pdf
• Requisiti sistema: Formato html, pdf
• Titolo autorizzato: Automated Technology for Verification and Analysis
• ISBN: 9783540883876
• Formato: Risorse elettroniche
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 990009257720403321
• Lo trovi qui: Univ. Federico II
• Localizzazioni e accesso elettronico: http://dx.doi.org/10.1007/978-3-540-88387-6