| Titolo: |
Ellipsometry of Functional Organic Surfaces and Films / Karsten Hinrichs, Klaus-Jochen Eichhorn editors
|
| Pubblicazione: |
Cham, : Springer, 2018 |
| Titolo uniforme: |
Ellipsometry of Functional Organic Surfaces and Films
|
| Edizione: |
2. ed |
| Descrizione fisica: |
xxvi, 547 p. : ill. ; 24 cm |
| Soggetto topico: |
92Exx - Chemistry [MSC 2020] |
| |
78A60 - Lasers, masers, optical bistability, nonlinear optics [MSC 2020] |
| |
74K35 - Thin films [MSC 2020] |
| |
74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020] |
| Soggetto non controllato: |
Biomolecules at Surfaces |
| |
Characterization of Organic Semiconductors |
| |
Ellipsometric Real-time/In-situ Monitoring Techniques |
| |
Functional and Smart Films |
| |
In-Situ Monitoring Techniques |
| |
Infrared Brillant Light Sources for Micro-ellipsometric Studies |
| |
Microscopic and imaging ellipsometry |
| |
OLEDs and OTFT |
| |
Optical Constants of Organic Layers |
| |
Organic and Hybrid Materials |
| |
Smart Polymer Surfaces and Films |
| Persona (resp. second.): |
Eichhorn, Klaus-Jochen |
| |
Hinrichs, Karsten |
| Titolo autorizzato: |
Ellipsometry of Functional Organic Surfaces and Films |
|
| Formato: |
Materiale a stampa  |
| Livello bibliografico |
Monografia |
| Lingua di pubblicazione: |
Inglese |
| Record Nr.: | VAN0208486 |
|
| Lo trovi qui: | Univ. Vanvitelli |
| Localizzazioni e accesso elettronico |
http://doi.org/10.1007/978-3-319-75895-4 |
| Opac: |
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