Titolo: |
Topics on methodological and applied statistical inference / Tonio Di Battista, Elías Moreno, Walter Racugno editors
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Pubblicazione: |
[Cham], : Springer, 2016 |
Titolo uniforme: |
Topics on methodological and applied statistical inference
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Descrizione fisica: |
X, 220 p. : ill. ; 24 cm |
Soggetto topico: |
00B25 - Proceedings of conferences of miscellaneous specific interest [MSC 2020] |
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62-XX - Statistics [MSC 2020] |
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62F15 - Bayesian inference [MSC 2020] |
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62M10 - Time series, auto-correlation, regression, etc. in statistics (GARCH) [MSC 2020] |
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62Dxx - Statistical sampling theory and related topics [MSC 2020] |
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62C12 - Empirical decision procedures; empirical Bayes procedures [MSC 2020] |
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62Pxx - Applications of statistics [MSC 2020] |
Soggetto non controllato: |
Applied Statistics |
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Bayesian Inference |
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Likelihood approach |
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Meta-analysis |
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Outliers |
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Pseudo-likelihoods |
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Regression |
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Robustness |
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Statistical Data Analysis |
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Statistical applications in the life sciences |
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Statistical applications in the social sciences |
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Time series |
Persona (resp. second.): |
Di Battista, Tonio |
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Moreno, Elías |
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Racugno, Walter |
Titolo autorizzato: |
Topics on methodological and applied statistical inference |
Formato: |
Materiale a stampa |
Livello bibliografico |
Monografia |
Lingua di pubblicazione: |
Inglese |
Record Nr.: | VAN0115452 |
Lo trovi qui: | Univ. Vanvitelli |
Localizzazioni e accesso elettronico |
http://dx.doi.org/10.1007/978-3-319-44093-4 |
Opac: |
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