Defects in Organic Semiconductors and Devices

• Autore: Nguyen Thien-Phap
• Pubblicazione: Newark : , : John Wiley & Sons, Incorporated, , 2023; ©2023
• Descrizione fisica: 1 online resource (279 pages)
• Soggetto topico: Organic semiconductors; Semiconductor doping
• Nota di contenuto: Cover -- Title Page -- Copyright Page -- Contents -- Abbreviations -- Introduction -- Chapter 1. Overview of Organic Semiconductors -- 1.1. Organic semiconductors -- 1.2. Doping of organic semiconductors -- 1.3. Organic electronic devices -- 1.3.1. Architectures of organic devices -- 1.3.2. Organic light-emitting diodes (OLEDs) -- 1.3.3. Organic solar cells (OSCs or OPVs) -- 1.3.4. Organic field-effect transistors (OFETs) -- Chapter 2. Defects in Materials -- 2.1. Order and disorder -- 2.2. Crystalline semiconductors -- 2.2.1. Localized states -- 2.2.2. Density of states (DOS) -- 2.3. Amorphous semiconductors -- 2.3.1. Localized states -- 2.3.2. Density of states (DOS) -- 2.4. Organic semiconductors -- 2.4.1. Polymer structure -- 2.4.2. Polymer crystallinity -- 2.4.3. Defects in conjugated polymers -- 2.4.4. Defects in small-molecule crystals -- 2.4.5. Localized states -- 2.4.6. Density of states -- 2.5. Distribution of the energetic states -- Chapter 3. Defects and Physical Properties of Semiconductors -- 3.1. Carrier transport in organic semiconductors -- 3.1.1. Hopping conduction -- 3.1.2. Uniform density of states model -- 3.1.3. Non-uniform density of states models -- 3.2. Effects of defects on the carrier transport -- 3.2.1. Traps and recombination centers -- 3.2.2. Trapping mechanisms and trap parameters -- 3.3. Optical properties of semiconductors and defects -- 3.3.1. Defects and absorption -- 3.3.2. Defects and luminescence -- Chapter 4. Techniques for Studying Defects in Semiconductors -- 4.1. Electron spin resonance (ESR) -- 4.1.1. Basic concepts of ESR -- 4.1.2. Interpretation of ESR line -- 4.1.3. Electron nuclear double resonance (ENDOR) -- 4.1.4. Investigation of defects using the ESR technique -- 4.2. Optical techniques -- 4.2.1. Fluorescence spectroscopy (FL) -- 4.2.2. Thermally stimulated luminescence (TSL) spectroscopy. ; 4.3. Electrical techniques -- 4.3.1. Thermally stimulated current (TSC) technique -- 4.3.2. Current-voltage measurements: space charge-limited current (SCLC) -- 4.3.3. Impedance spectroscopy (IS) -- 4.3.4. Deep-level transient spectroscopy (DLTS) -- 4.3.5. Time of flight (TOF) and charge carrier extraction by linearly increasing voltage (CELIV) techniques -- Chapter 5. Defect Origins -- 5.1. Defects in organic semiconductors -- 5.1.1. Structural defects -- 5.1.2. Impurity defects -- 5.2. Defects in organic devices -- 5.2.1. Defects from the semiconductor -- 5.2.2. Defects from the surface and the interface -- 5.2.3. Defects from diffused impurities -- Chapter 6. Defects, Performance and Reliability of Organic Devices -- 6.1. Impact of defects on the performance of organic devices -- 6.1.1. Defects and efficiency of OLEDs -- 6.1.2. Defects and efficiency of OPVs -- 6.1.3. Defects and performance of OFETs -- 6.2. Impact of defects on the stability of organic devices -- 6.2.1. Overview of degradation mechanisms in organic semiconductors and devices -- 6.2.2. Defects and degradation of organic semiconductor and devices -- Future Prospects -- References -- Index -- EULA.
• Sommario/riassunto: This book, authored by Thien-Phap Nguyen, explores the topic of defects in organic semiconductors and electronic devices. It provides a comprehensive overview of organic materials, focusing on their structure, doping, and the architectures of various organic electronic devices such as diodes, solar cells, and transistors. The book delves into the nature of defects within these materials, examining their impact on carrier transport, trapping mechanisms, and optical properties. It also discusses various techniques for studying these defects, including electron spin resonance, fluorescence spectroscopy, and electrical measurement techniques. The work is intended for researchers, engineers, and professionals in the field of organic electronics, offering insights into the challenges and advancements in the study and application of organic materials in electronic devices.
• Titolo autorizzato: Defects in Organic Semiconductors and Devices
• ISBN: 9781394229451; 1394229453; 9781394229437; 1394229437
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9911019272603321
• Lo trovi qui: Univ. Federico II