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Titolo: | Applications of texture analysis : a collection of papers presented at the 15th International Conference on Textures of Materials (ICOTOM 15), June 1-6, 2008, Pittsburgh, Pennsylvania / / edited by A.D. Rollett |
Pubblicazione: | Hoboken, N.J., : Wiley, c2009 |
Descrizione fisica: | 1 online resource (838 p.) |
Disciplina: | 620.11 |
Soggetto topico: | Materials - Texture |
Metals - Texture | |
Texture (Crystallography) | |
Classificazione: | UQ 8500 |
Altri autori: | RollettA. D (Anthony D.) |
Note generali: | "American Ceramic Society." |
Nota di bibliografia: | Includes bibliographical references and index. |
Nota di contenuto: | Applications of Texture Analysis; Contents; Preface; Acknowledgments; THIN FILMS (MICROELECTRONICS, HTSC; The Texture of Thin NiSi Films and Its Effect on Agglomeration; Epitaxial Substrates from Ni-Based Ternary Alloys With Cr and W; Cube Texture Formation in Ni-Pd and Ni-Pd-W Alloys For HTS Tapes; Texture of Rapidly Solidified Cu Thin Films Studied by SEM EBSD and TEM; Control of Texture in Polycrystalline Thin Films Used as DataStorage Media; Influences of Processing Parameters on Microstructures and Microtextures of Au Flip Chip Bonds During Microelectronics Packaging |
TEXTURE AT NON-AMBIENT CONDITIONSIn Situ Observation of Texture Evolution in Ti-10-2-3; Study of Texture Evolution at High Strain Rates in FCC Materials; Texture and Microstructure Development in Copper after Cryogenic Rolling and Heat Treatment; In-Situ EBSD Study of the α-γ-α Phase Transformation in a Microalloyed Steel; Texture Changes during Phase Transformations Studied In Situ With Neutron Diffraction; NOVEL TEXTURE MEASUREMENT TECHNIQUES INCLUDING 3D; Three-Dimensional FIB-OIM of Ceramic Materials; Comparison of X-Ray and EBSD Textures for Back-Annealed Al-Mg Alloys | |
A New Method for Quantification of Texture Uniformity of PlateSeparating Coincident Electron Backscatter Diffraction Patterns Near Interfaces; Rapid Texture Determination Based on Two Dimensional X Ray Detector; Semiautomatic Determination of Orientations and Elastic Strain from Kossel Microdiffraction; Statistically Reliable EBSD Analysis Method of Grain Boundary Characterization; 3D Microstructures and Textures of a Plane Strain Compressed {1 10} AI-0.3% Mn Single Crystal | |
Three Laws of Substructure Anisotropy of Textured Metal Materials, Revealed by X-Ray Method of Generalized Pole Figures3D-Microstructural and Texture Characterization in Different Length Scales; Local Crystal Rotations of Bulk Grains by High-Resolution EBSD during Hot PSC of AI-0.1 % Mn Polycrystals; Grain Boundary Orientations in a Fe-Mn-Cu Polycrystalline Alloy; Development of a TEM-Based Orientation Microscopy System; COMPLEX OXIDES AND OTHER COMPOUNDS; Domain Control Effect on Voltage-Strain in BaTiO3 Single Crystal; Tentative Simulation of Crystal Rotation for NaCl Structures | |
INTERFACE TEXTURESGrain Boundary Patterns in Dynamically Recrystallized Quartz Aggregates; The Correlation between Grain Boundary Character and lntergranular Corrosion Susceptibility of 2124 Aluminum Alloy; Rodrigues-Frank Spaces for Misorientations and Orientation Relationships between Crystals of Any Two Crystallographic Point Groups; Origins of Texture Memory in Steels; A Grain Boundary Analysis of Cemented Tungsten Carbides using OIM; The Effect of Grain and Phase Boundary Misorientation on Nucleation during Solid-State Phase Transformations in a Co-15Fe Alloy | |
Microstructural Modification in a 15Cr-1 5Ni-2.2 Mo-Ti Modified Austenitic Stainless Steel through Twin Induced Grain Boundary Engineering | |
Sommario/riassunto: | This volume contains papers presented at The 15th International Conference on the Texture of Materials from June 1-5th, 2008 in Pittsburgh, PA. Chapters include: Thin FilmsTexture at Non-Ambient ConditionsNovel Texture Measurement Techniques Including 3DComplex OxidesInterface TexturesRecrystallization TextureBiomaterialsTexture Effects on Damage AccumulationDigital MicrostructuresView information on Materials Processing and Texture: Ceramic Transactions, Volume 200. |
Titolo autorizzato: | Applications of texture analysis |
ISBN: | 1-282-11349-6 |
9786612113499 | |
0-470-44421-5 | |
0-470-44420-7 | |
Formato: | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910877543103321 |
Lo trovi qui: | Univ. Federico II |
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