Total system accuracy for APPS (the analytical photogrammetric positioning system) / / E. Sewell, A. Harabedian, and Thomas E. Jeffrey
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| Autore: |
Sewell Eldon DeMorse <1916-1998, >
|
| Titolo: |
Total system accuracy for APPS (the analytical photogrammetric positioning system) / / E. Sewell, A. Harabedian, and Thomas E. Jeffrey
|
| Pubblicazione: | Alexandria, VA : , : U. S. Army Research Institute for the Behavioral and Social Sciences, , October 1978 |
| Descrizione fisica: | 1 online resource (6 unnumbered pages, 58 pages) : illustrations |
| Soggetto topico: | Imaging systems |
| Photogrammetry | |
| Persona (resp. second.): | HarabedianA |
| JeffreyThomas E. <1911-1989, > | |
| Note generali: | Title from title screen (viewed Dec. 1, 2015). |
| "October 1978." | |
| "Human Factors Technical Area." | |
| "Performing organization: Raytheon Company, Equipment Division, Autometric"--Report documentation page. | |
| Nota di bibliografia: | Includes bibliographical references. |
| Altri titoli varianti: | Total system accuracy for APPS |
| Titolo autorizzato: | Total system accuracy for APPS (the analytical photogrammetric positioning system) |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910704160303321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |