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IEEE Std 1241-2010 (Revision of IEEE Std 1241-2000) : IEEE standard for terminology and test methods for analog-to-digital converters / / IEEE



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Titolo: IEEE Std 1241-2010 (Revision of IEEE Std 1241-2000) : IEEE standard for terminology and test methods for analog-to-digital converters / / IEEE Visualizza cluster
Pubblicazione: [Place of publication not identified] : , : IEEE, , 2011
Descrizione fisica: 1 online resource
Disciplina: 621.39814
Soggetto topico: Analog-to-digital converters
Electromagnetic waves
Sommario/riassunto: The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization. Keywords: ADC, analog-to-digital converter, code transition level, coherent sampling, DNL, ENOB, histogram, INL, LSB, missing codes, noise power ratio, noncoherent sampling, quantization error, quantization noise, SAR, SFDR, sine fitting.
Altri titoli varianti: IEEE Std 1241-2010 (Revision of IEEE Std 1241-2000): IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
IEEE Std 1241-2010
Titolo autorizzato: IEEE Std 1241-2010 (Revision of IEEE Std 1241-2000)  Visualizza cluster
ISBN: 0-7381-6239-6
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 996280740303316
Lo trovi qui: Univ. di Salerno
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