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Accelerated testing [[electronic resource] ] : statistical models, test plans and data analysis / / Wayne Nelson



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Autore: Nelson Wayne <1936-> Visualizza persona
Titolo: Accelerated testing [[electronic resource] ] : statistical models, test plans and data analysis / / Wayne Nelson Visualizza cluster
Pubblicazione: New York, : Wiley, c1990
Descrizione fisica: 1 online resource (xiv, 601 p. ) : ill
Disciplina: 519.5
Soggetto topico: Failure time data analysis
Reliability (Engineering) - Statistical methods
Accelerated life testing - Statistical methods
Note generali: Originally published: 1990.
Nota di bibliografia: Includes bibliographical references and index.
Nota di contenuto: Preface. 1. Introduction and Background. 2. Models for Life Tests with Constant Stress. 3. Graphical Data Analysis. 4. Complete Data and Least Squares Analyses. 5. Censored Data and Maximum Likelihood Methods. 6. Test Plans. 7. Competing Failure Modes and Size Effect. 8. Least-Squares Comparisons for Complete Data. 9. Maximum Likelihood Comparisons for Censored and Other Data. 10. Models and Data Analyses for Step and Varying Stress. 11. Accelerated Degradation. Appendix A. Statistical Tables. References. Index.
Sommario/riassunto: Useful methodology has been developed in accelerated testing. This work deals with the topic Accelerated Testing: Statistical Models, Test Plans, and Data Analyses. It is useful for practitioners.
Titolo autorizzato: Accelerated testing  Visualizza cluster
ISBN: 1-282-30782-7
9786612307829
0-470-31679-9
0-470-31747-7
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910830596903321
Lo trovi qui: Univ. Federico II
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Serie: Wiley series in probability and statistics. Wiley-Interscience paperback series.