Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test

• Pubblicazione: Piscataway, NJ : , : IEEE
• Disciplina: 621
• Soggetto topico: Integrated circuits - Very large scale integration - Design and construction; Integrated circuits - Very large scale integration - Testing; Integrated circuits - Very large scale integration
• Soggetto genere / forma: Conference papers and proceedings.
• ISSN: 2472-9124
• Titolo abbreviato (Periodici): Proc. Tech. Program Int. Symp. VLSI Des. Autom. Test
• Altri titoli varianti: Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation & Test; VLSI-DAT ..; International Symposium on VLSI Design, Automation & Test; IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT)
• Titolo autorizzato: Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test
• Formato: Materiale a stampa
• Livello bibliografico: Periodico
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910626138603321
• Lo trovi qui: Univ. Federico II