IEEE trial-use standard for testability and diagnosability characteristics and metrics / / IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board
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| Titolo: |
IEEE trial-use standard for testability and diagnosability characteristics and metrics / / IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board
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| Pubblicazione: | New York, N.Y. : , : Institute of Electrical and Electronics Engineers, , 2005 |
| Descrizione fisica: | 1 online resource (v, 35 pages) |
| Disciplina: | 006.3 |
| Soggetto topico: | Artificial intelligence - Standards |
| Expert systems (Computer science) - Standards | |
| Sommario/riassunto: | This standard was developed to provide standard, unambiguous definitions of testability diagnosability metrics and characteristics. It builds on fundamental definitions derived from elements in formal information models related to test and diagnosis defined in IEEE Std 1232-2002. |
| Altri titoli varianti: | IEEE Std 1522-2004: IEEE Trial-Use Standard for Testability and Diagnosability Characteristics and Metrics |
| Titolo autorizzato: | IEEE trial-use standard for testability and diagnosability characteristics and metrics |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910147249403321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |