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The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing



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Titolo: The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing Visualizza cluster
Pubblicazione: New York : , : IEEE, , 2008
Descrizione fisica: 1 online resource (xxxi, 545 pages)
Soggetto topico: Integrated circuits - Very large scale integration - Design and construction
Fault-tolerant computing
Persona (resp. second.): BolchiniCristiana
KimYong-Bin
GizopoulosDimitris
TehranipoorMohammad H. <1974->
Note generali: Includes index.
Titolo autorizzato: The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems  Visualizza cluster
ISBN: 1-5090-8441-X
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910145668103321
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