Frontiers in Optical Methods : Nano-Characterization and Coherent Control / Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno editors

• Pubblicazione: Berlin, : Springer, 2014
• Titolo uniforme: Frontiers in Optical Methods
• Descrizione fisica: xii, 228 p. : ill. ; 24 cm
• Soggetto topico: 78A55 - Technical applications of optics and electromagnetic theory [MSC 2020]; 78-XX - Optics, electromagnetic theory [MSC 2020]; 00A79 (77-XX) - Physics [MSC 2020]; 00B15 - Collections of articles of miscellaneous specific interest [MSC 2020]; 82D80 - Statistical mechanical studies of nanostructures and nanoparticles [MSC 2020]
• Soggetto non controllato: Extreme methods in optical measurements; Laser; Microstructures; Phonon techniques; Surface differential reflectance spectroscopy; Synchrotron Radiation; THz spectroscopy; Ultrafast spectroscopy; Wave propagation in thin films; X-ray technicques
• Persona (resp. second.): Katayama, Ikufumui; Ohno, Shin-Ya; Shudo, Ken-ichi
• Titolo autorizzato: Frontiers in Optical Methods
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: VAN0133211
• Lo trovi qui: Univ. Vanvitelli
• Localizzazioni e accesso elettronico: http://doi.org/10.1007/978-3-642-40594-5
• Serie: Springer series in optical sciences Berlin [etc.] . -Springer ; 180